Browse by Author or creator

Group by: Publication Date | Item type | No Grouping

Jump to: 2024 | 2023 | 2022 | 2021 | 2020 | 2019 | 2018 | 2017 | 2016 | 2015 | 2014 | 2013 | 2012 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2002 | 2001

Number of items: 75.

2024

Nicholson, Stefan and Bruckbauer, Jochen and Edwards, Paul and Trager-Cowan, Carol and Martin, Robert and Ivaturi, Aruna (2024) Unravelling the chloride dopant induced film improvement in all-inorganic perovskite absorbers. Journal of Materials Chemistry. A, 12 (37). pp. 25131-25139. ISSN 2050-7488

2023

Hiller, Kieran P and Winkelmann, Aimo and Hourahine, Ben and Starosta, Bohdan and Alasmari, Aeshah and Feng, Peng and Wang, Tao and Parbrook, Peter J and Zubialevich, Vitaly Z and Hagedorn, Sylvia and Walde, Sebastian and Weyers, Markus and Coulon, Pierre-Marie and Shields, Philip A and Bruckbauer, Jochen and Trager-Cowan, Carol (2023) Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction. Microscopy and Microanalysis, 29 (6). pp. 1879-1888. ISSN 1431-9276

2022

Ghosh, Paheli and Bruckbauer, Jochen and Trager-Cowan, Carol and Jagadamma, Lethy Krishnan (2022) Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics. Applied Surface Science, 592. 152865. ISSN 0169-4332

Naresh-Kumar, G. and Edwards, P. R. and Batten, T. and Nouf-Allehiani, M. and Vilalta-Clemente, A. and Wilkinson, A. J. and Le Boulbar, E. and Shields, P. A. and Starosta, B. and Hourahine, B. and Martin, R. W. and Trager-Cowan, C. (2022) Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy. Journal of Applied Physics, 131 (7). 075303. ISSN 0021-8979

2021

Winkelmann, Aimo and Nolze, Gert and Cios, Grzegorz and Tokarski, Tomasz and Bała, Piotr and Hourahine, Ben and Trager‐Cowan, Carol (2021) Kikuchi pattern simulations of backscattered and transmitted electrons. Journal of Microscopy, 284 (2). pp. 157-184. ISSN 0022-2720

2020

Bruckbauer, Jochen and Gong, Yipin and Jiu, Ling and Wallace, Michael J and Ipsen, Anja and Bauer, Sebastian and Müller, Raphael and Bai, Jie and Thonke, Klaus and Wang, Tao and Trager-Cowan, Carol and Martin, Robert W (2020) Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (11-20) GaN. Journal of Physics D: Applied Physics, 54 (2). 025107. ISSN 1361-6463

De Luca, F. and Zhang, H. and Mingard, K. and Stewart, M. and Jablon, B. M. and Trager-Cowan, C. and Gee, M. G. (2020) Nanomechanical behaviour of individual phases in WC-Co cemented carbides, from ambient to high temperature. Materialia, 12. 100713. ISSN 2589-1529

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Jablon, B. M. and Johnston, R. and Martin, R. W. and McDermott, R. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Pascal, E. and Thomson, D. and Vespucci, S. and Mingard, K. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Knauer, A. and Hagedorn, S. and Walde, S. and Weyers, M. and Coulon, P-M and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Y. and Smith, R. M. and Wang, T. and Winkelmann, A. (2020) Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope. IOP Conference Series: Materials Science and Engineering, 891 (1). 012023. ISSN 1757-899X

Zhao, X. and Huang, K. and Bruckbauer, J. and Shen, S. and Zhu, C. and Fletcher, P. and Feng, P. and Cai, Y. and Bai, J. and Trager-Cowan, C. and Martin, R. W. and Wang, T. (2020) Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11–22) green LEDs grown on silicon. Scientific Reports, 10 (1). 12650. ISSN 2045-2322

Naresh-Kumar, G. and Alasamari, A. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mingard, K. P. and Trager-Cowan, C. (2020) Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope. Ultramicroscopy, 213. 112977. ISSN 0304-3991

Trager-Cowan, Carol and Alasmari, Aeshah and Avis, William and Bruckbauer, Jochen and Edwards, Paul R and Ferenczi, Gergely and Hourahine, Benjamin and Kotzai, Almpes and Kraeusel, Simon and Kusch, Gunnar and Martin, Robert W and McDermott, Ryan and Gunasekar, Naresh and Nouf-Allehiani, M. and Pascal, Elena and Thomson, David and Vespucci, Stefano and Smith, Matthew David and Parbrook, Peter J and Enslin, Johannes and Mehnke, Frank and Kuhn, Christian and Wernicke, Tim and Kneissl, Michael and Hagedorn, Sylvia and Knauer, Arne and Walde, Sebastian and Weyers, Markus and Coulon, Pierre-Marie and Shields, Philip and Bai, J. and Gong, Y. and Jiu, Ling and Zhang, Y. and Smith, Richard and Wang, Tao and Winkelmann, Aimo (2020) Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope. Semiconductor Science and Technology, 35 (5). 054001. ISSN 0268-1242

Jablon, B.M. and Mingard, K. and Winkelmann, A. and Naresh-Kumar, G. and Hourahine, B. and Trager-Cowan, C. (2020) Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging. International Journal of Refractory Metals and Hard Materials, 87. 105159. ISSN 0263-4368

Winkelmann, A. and Jablon, B.M. and Tong, V.S. and Trager-Cowan, C. and Mingard, K.P. (2020) Improving EBSD precision by orientation refinement with full pattern matching. Journal of Microscopy, 277 (2). pp. 79-92. ISSN 0022-2720

Walde, S. and Hagedorn, S. and Coulon, P.-M. and Mogilatenko, A. and Netzel, C. and Weinrich, J. and Susilo, N. and Ziffer, E. and Matiwe, L. and Hartmann, C. and Kusch, G. and Alasmari, A. and Naresh-Kumar, G. and Trager-Cowan, C. and Wernicke, T. and Straubinger, T. and Bickermann, M. and Martin, R. W. and Shields, P. A. and Kneissl, M. and Weyers, M. (2020) AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy. Journal of Crystal Growth, 531. 125343. ISSN 0022-0248

Bruckbauer, Jochen and Trager-Cowan, Carol and Hourahine, Ben and Winkelmann, Aimo and Vennéguès, Philippe and Ipsen, Anja and Yu, Xiang and Zhao, Xunming and Wallace, Michael J. and Edwards, Paul R. and Naresh-Kumar, G. and Hocker, Matthias and Bauer, Sebastian and Müller, Raphael and Bai, Jie and Thonke, Klaus and Wang, Tao and Martin, Robert W. (2020) Luminescence behavior of semipolar (10-11) InGaN/GaN "bow-tie" structures on patterned Si substrates. Journal of Applied Physics, 127 (3). 035705. ISSN 0021-8979

2019

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Johnston, R. and Naresh-Kumar, G. and Martin, R. W. and Nouf-Allehiani, M. and Pascal, E. and Spasevski, L. and Thomson, D. and Vespucci, S. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Hagedorn, S. and Knauer, A. and Kueller, V. and Walde, S. and Weyers, M. and Coulon, P.-M. and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Yipin and Smith, R. M. and Wang, T. and Winkelmann, A. (2019) Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research, 7 (11). B73-B82. ISSN 2327-9125

Massabuau, Fabien C.-P and Bruckbauer, Jochen and Trager-Cowan, Carol and Oliver, Rachel A; Tuomisto, Filip, ed. (2019) Microscopy of defects in semiconductors. In: Characaterisation and Control of Defects in Semiconductors. Materials, Circuits and Devices . IET, [S.I.]. ISBN 978-1-78561-655-6

Pascal, Elena and Hourahine, Ben and Trager-Cowan, Carol and De Graef, Marc (2019) Two beam toy model for dislocation contrast in ECCI. Microscopy and Microanalysis, 25 (S2). pp. 1968-1969.

Naresh-Kumar, G. and Bruckbauer, J. and Winkelmann, A. and Yu, X. and Hourahine, B. and Edwards, P. R. and Wang, T. and Trager-Cowan, C. and Martin, R. W. (2019) Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope. Nano Letters, 19 (6). pp. 3863-3870. ISSN 1530-6992

2018

Naresh-Kumar, G. and Thomson, David and Zhang, Y. and Bai, J. and Jiu, L. and Yu, X. and Gong, Y. P. and Martin, Richard Smith and Wang, Tao and Trager-Cowan, Carol (2018) Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging. Journal of Applied Physics, 124 (6). 065301. ISSN 0021-8979

Edwards, Paul R. and Naresh-Kumar, G. and Kusch, Gunnar and Bruckbauer, Jochen and Spasevski, Lucia and Brasser, Catherine G. and Wallace, Michael J. and Trager-Cowan, Carol and Martin, Robert W. (2018) You do what in your microprobe?! The EPMA as a multimode platform for nitride semiconductor characterization. Microscopy and Microanalysis, 24 (S1). pp. 2026-2027. ISSN 1431-9276

Pascal, E. and Hourahine, B. and Naresh-Kumar, G. and Mingard, K. and Trager-Cowan, C. (2018) Dislocation contrast in electron channelling contrast images as projections of strain-like components. Materials Today: Proceedings, 5 (Issue ). 14652–14661. ISSN 2214-7853

Pascal, Elena and Singh, Saransh and Callahan, Patrick G. and Hourahine, Ben and Trager-Cowan, Carol and De Graef, Marc (2018) Energy-weighted dynamical scattering simulations of electron diffraction modalites in the scanning electron microscope. Ultramicroscopy, 187. pp. 98-106. ISSN 0304-3991

Mingard, K.P. and Stewart, M. and Gee, M.G. and Vespucci, S. and Trager-Cowan, C. (2018) Practical application of direct electron detectors to EBSD mapping in 2D and 3D. Ultramicroscopy, 184 (Part A). pp. 242-251. ISSN 0304-3991

2017

Naresh-Kumar, G. and Vilalta-Clemente, A. and Jussila, H. and Winkelmann, A. and Nolze, G. and Vespucci, S. and Nagarajan, S. and Wilkinson, A.J. and Trager-Cowan, C. (2017) Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction. Scientific Reports, 7. 10916. ISSN 2045-2322

Bruckbauer, Jochen and Li, Zhi and Naresh-Kumar, G. and Warzecha, Monika and Edwards, Paul R. and Jiu, Ling and Gong, Yipin and Bai, Jie and Wang, Tao and Trager-Cowan, Carol and Martin, Robert W. (2017) Spatially-resolved optical and structural properties of semi-polar (11-22) AlxGa1-xN with x up to 0.56. Scientific Reports, 7. 10804. ISSN 2045-2322

Pascal, Elena and Singh, Saransh and Hourahine, Ben and Trager-Cowan, Carol and De Graef, Marc (2017) Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns. Microscopy and Microanalysis, 23 (S1). pp. 540-541. ISSN 1431-9276

Le Boulbar, E. D. and Priesol, J. and Nouf-Allehiani, M. and Naresh-Kumar, G. and Fox, S. and Trager-Cowan, C. and Šatka, A. and Allsopp, D. W. E. and Shields, P. A. (2017) Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes. Journal of Crystal Growth. pp. 30-38. ISSN 0022-0248

Winkelmann, A. and Nolze, G. and Vespucci, S. and Gunasekar, N. and Trager-Cowan, C. and Vilalta-Clemente, A. and Wilkinson, A. J. and Vos, M. (2017) Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications. Journal of Microscopy. ISSN 0022-2720

Vespucci, S. and Naresh-Kumar, G. and Trager-Cowan, C. and Mingard, K. P. and Maneuski, D. and O'Shea, V. and Winkelmann, A. (2017) Diffractive triangulation of radiative point sources. Applied Physics Letters, 110 (12). 124103. ISSN 0003-6951

Vespucci, S. and Winkelmann, A. and Mingard, K. and Maneuski, D. and O'Shea, V. and Trager-Cowan, C. (2017) Exploring transmission Kikuchi diffraction using a Timepix detector. Journal of Instrumentation, 12. C02075. ISSN 1748-0221

Vilalta-Clemente, A. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Gamarra, P. and di Forte-Poisson, M.A. and Trager-Cowan, C. and Wilkinson, A.J. (2017) Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films. Acta Materialia, 125. pp. 125-135. ISSN 1359-6454

Smith, M. D. and Thomson, D. and Zubialevich, V. Z. and Li, H. and Naresh-Kumar, G. and Trager-Cowan, C. and Parbrook, P. J. (2017) Nanoscale fissure formation in AlxGa1–xN/GaN heterostructures and their influence on Ohmic contact formation. Physica Status Solidi A, 214 (1). 1600353. ISSN 1862-6300

2016

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R. W. and Trager-Cowan, C. (2016) Reprint of : Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 55. pp. 19-25. ISSN 1369-8001

Vespucci, Stefano and Trager-Cowan, Carol and Maneuski, Dzmitry and O'Shea, Val and Winkelmann, Aimo (2016) Diffractive triangulation of radiative point sources. Preprint / Working Paper. arXiv.org, Ithaca, NY.

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R.W. and Trager-Cowan, C. (2016) Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 47. pp. 44-50. ISSN 1369-8001

2015

Vespucci, S. and Winkelmann, A. and Naresh-Kumar, G. and Mingard, K. P. and Maneuski, D. and Edwards, P. R. and Day, A. P. and O'Shea, V. and Trager-Cowan, C. (2015) Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns. Physical Review B (Condensed Matter), 92 (20). 205301. ISSN 0163-1829

Kusch, Gunnar and Nouf-Allehiani, M. and Mehnke, Frank and Kuhn, Christian and Edwards, Paul R. and Wernicke, Tim and Knauer, Arne and Kueller, Viola and Naresh-Kumar, G. and Weyers, Markus and Kneissl, Michael and Trager-Cowan, Carol and Martin, Robert W. (2015) Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N. Applied Physics Letters, 107 (7). 072103. ISSN 0003-6951

2014

Naresh-Kumar, G. and Vilalta-Clemente, A. and Pandey, S. and Skuridina, D. and Behmenburg, H. and Gamarra, P. and Patriarche, G. and Vickridge, I. and di Forte-Poisson, M. A. and Vogt, P. and Kneissl, M. and Morales, M. and Ruterana, P. and Cavallini, A. and Cavalcoli, D. and Giesen, C. and Heuken, M. and Trager-Cowan, C. (2014) Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors. AIP Advances, 4 (12). 127101. ISSN 2158-3226

Trager-Cowan, C. and Naresh-Kumar, G. and Allehiani, N. and Kraeusel, S. and Hourahine, B. and Vespucci, S. and Thomson, D. and Bruckbauer, J. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mauder, C. and Day, A. P. and Winkelmann, A. and Vilalta-Clemente, A. and Wilkinson, A. J. and Parbrook, P. J. and Kappers, M. J. and Moram, M. A. and Oliver, R. A. and Humphreys, C. J. and Shields, P. and Le Boulbar, E. D. and Maneuski, D. and O'Shea, V. and Mingard, K. P. (2014) Electron channeling contrast imaging of defects in III-nitride semiconductors. Microscopy and Microanalysis, 20 (S3). pp. 1024-1025. ISSN 1435-8115

Edwards, Paul R. and Wallace, Michael J. and Kusch, Gunnar and Naresh-Kumar, Gunasekar and Bruckbauer, Jochen and Trager-Cowan, Carol and O'Donnell, Kevin P. and Martin, Robert W. (2014) Cathodoluminescence hyperspectral imaging of nitride semiconductors : introducing new variables. Microscopy and Microanalysis, 20 (S3). pp. 906-907. ISSN 1435-8115

Naresh-Kumar, G. and Bruckbauer, J. and Edwards, P. R. and Kraeusel, S. and Hourahine, B. and Martin, R. W. and Kappers, M. J. and Moram, M. A. and Lovelock, S. and Oliver, R. A. and Humphreys, C. J. and Trager-Cowan, C. (2014) Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN. Microscopy and Microanalysis, 20 (1). pp. 55-60. ISSN 1431-9276

2013

Naresh Kumar, G. and Mauder, C and Wang, K.R. and Kraeusel, Simon and Bruckbauer, Jochen and Edwards, P. R. and Hourahine, Benjamin and Kalisch, H. and Vescan, A. and Giesen, C. and Heuken, M and Trampert, A. and Day, A.P. and Trager-Cowan, Carol (2013) Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope. Applied Physics Letters, 102 (14). 142103. ISSN 0003-6951

Nagarajan, S. and Svensk, O. and Ali, M. and Naresh-Kumar, G. and Trager-Cowan, Carol and Suihkonen, S. and Sopanen, M. and Lipsanen, H. (2013) Stress distribution of GaN layer grown on micro-pillar patterned GaN templates. Applied Physics Letters, 103 (1). 012102. ISSN 0003-6951

2012

Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Day, A.P. and Winkelmann, Aimo and Wilkinson, A.J. and Parbrook, P.J. and England, G. and Trager-Cowan, Carol (2012) Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. Physical Review Letters, 108 (13). 135503. ISSN 1079-7114

Naresh-Kumar, G. and Hourahine, Benjamin and Vilalta-Clemente, A. and Ruterana, P. and Gamarra, P. and Lacam, C. and Tordjman, M. and Forte-Poisson, M. A. di and Parbrook, P. J. and Day, A. P. and England, G. and Trager-Cowan, Carol (2012) Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope. Physica Status Solidi A, 209 (3). pp. 424-426. ISSN 1862-6300

Trager-Cowan, Carol and Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Bruckbauer, Jochen and Martin, Robert and Mauder, Christof and Day, Austin and England, Gordon and Winkelmann, Aimo and Parbrook, Peter and Wilkinson, Anjus (2012) Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films. Microscopy and Microanalysis, 18 (S2). pp. 684-685. ISSN 1431-9276

2010

Trager-Cowan, Carol (2010) Cafe scientifique: nobel laureate communicates science across the world. MRS Bulletin, 35 (1). pp. 10-11. ISSN 0883-7694

2009

Roqan, I.S. and O'Donnell, K.P. and Martin, R.W. and Trager-Cowan, C. and Matias, V. and Vantomme, A. and Lorenz, K. and Alves, E. and Watson, I.M. (2009) Optical and structural properties of Eu-implanted InxAl1−xN. Journal of Applied Physics, 106 (8). 083508. ISSN 0021-8979

Lorenz, K. and Roqan, I.S. and Franco, N. and O'Donnell, K.P. and Darakchieva, V. and Alves, E. and Trager-Cowan, C. and Martin, R.W. and As, D.J. and Panfilova, M., Fundacao para a Ciencia e Tecnologia (FCT), Portugal (Funder), HOYA Corporation (Funder), German Science Foundation (DFG) (Funder) (2009) Europium doping of zincblende GaN by ion implantation. Journal of Applied Physics, 105 (11). 113507. ISSN 0021-8979

2008

Trager-Cowan, C. (2008) The rank prize funds: nurturing advancement in optoelectronics. MRS Bulletin, 33 (11). pp. 999-1000. ISSN 0883-7694

Roqan, I.S. and Nogales, E. and O'Donnell, K.P. and Trager-Cowan, C. and Martin, R.W. and Halambalakis, G. and Briot, O. (2008) The effect of growth temperature on the luminescence and structural properties of gan : tm films grown by gas-source mbe. Journal of Crystal Growth, 310 (18). pp. 4069-4072. ISSN 0022-0248

Trager-Cowan, C. and Wilkinson, A. (2008) Introduction - Journal of Microscopy. Journal of Microscopy, 230 (3). p. 405. ISSN 0022-2720

Lorenz, K. and Alves, E. and Roqan, I.S. and Martin, R.W. and Trager-Cowan, C. and O'Donnell, K.P. and Watson, I.M. (2008) Rare earth doping of III-nitride alloys by ion implantation. Physica Status Solidi A, 205 (1). pp. 34-37. ISSN 1862-6300

Roqan, I.S. and O'Donnell, K.P. and Trager-Cowan, C. and Hourahine, B. and Martin, R.W. and Lorenz, K. and Alves, E. and As, D.J. and Panfilova, M. and Watson, I.M. (2008) Luminescence spectroscopy of Eu-implanted zincblende GaN. Physica Status Solidi B, 245 (1). pp. 170-173. ISSN 0370-1972

2007

Trager-Cowan, Carol (2007) Light makes an impact on the lives and healthcare of Scots. MRS Bulletin, 32 (8). pp. 673-674. ISSN 0883-7694

Trager-Cowan, C. and Sweeney, F. and Trimby, P. W. and Day, A. P. and Gholinia, A. and Schmidt, N. -H. and Parbrook, P. J. and Wilkinson, A. J. and Watson, I. M. (2007) Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films. Physical Review B, 75 (8). ISSN 1098-0121

Winkelmann, Aimo and Trager-Cowan, Carol and Sweeney, Francis and Day, Austin P. and Parbrook, Peter (2007) Many-Beam Dynamical Simulation of Electron Backscatter Diffraction Patterns. Ultramicroscopy, 107 (2007). pp. 414-421. ISSN 0304-3991

2006

Roqan, I. S. and Lorenz, K. and O'Donnell, K. P. and Trager-Cowan, C. and Martin, R. W. and Watson, I. M. and Alves, E. (2006) Blue cathodoluminescence from thulium implanted AlxGa1−xN and InxAl1−xN. Superlattices and Microstructures, 40 (4-6). pp. 445-451. ISSN 0749-6036

Trager-Cowan, C. and Sweeney, F. and Winkelmann, A. and Wilkinson, A.J. and Trimby, P.W. and Day, A.P. and Gholinia, A. and Schmidt, N.H. and Parbrook, P.J. and Watson, I.M. (2006) Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging. Materials Science and Technology, 22 (11). 1352-1358(7). ISSN 0267-0836

Roqan, Iman and Trager-Cowan, Carol and Hourahine, Ben and Lorenz, Katharina and Nogales, Emilio and O'Donnell, Kevin P. and Martin, Robert W. and Alves, Eduardo and Ruffenach, S. and Briot, Olivier; Kuball, M. and Mukai, T. and Myers, T.H. and Redwing, J.M., eds. (2006) Characterization of the blue emission of Tm/Er co-implanted GaN. In: GaN, AIN, InN and Related Materials. Materials Research Society Symposium Proceedings . Materials Research Society, USA, pp. 599-604. ISBN 9781558998469

Trager-Cowan, Carol and Sweeney, Francis and Wilkinson, A.J. and Trimby, P.W. and Day, A.P. and Gholinia, A and Schmidt, N.H. and Parbrook, P.J. and Watson, Ian; Kuball, M and Myers, T.H. and Redwing, J.M. and Mukai, T, eds. (2006) Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging. In: GaN, AIN, InN and related materials. Materials research society symposium proceedings . Materials Research Society, USA, pp. 677-682. ISBN 9781558998469