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2024

Sarkar, Maruf and Adams, Francesca and Dar, Sidra A. and Penn, Jordan and Ji, Yihong and Gundimeda, Abhiram and Zhu, Tongtong and Liu, Chaowang and Hirshy, Hassan and Massabuau, Fabien C.-P. and O'Hanlon, Thomas and Kappers, Menno J. and Ghosh, Saptarsi and Kusch, Gunnar and Oliver, Rachel A. (2024) Sub-surface imaging of porous GaN distributed Bragg reflectors via backscattered electrons. Microscopy and Microanalysis, 30 (2). pp. 208-225. ISSN 1431-9276

2023

Hiller, Kieran P and Winkelmann, Aimo and Hourahine, Ben and Starosta, Bohdan and Alasmari, Aeshah and Feng, Peng and Wang, Tao and Parbrook, Peter J and Zubialevich, Vitaly Z and Hagedorn, Sylvia and Walde, Sebastian and Weyers, Markus and Coulon, Pierre-Marie and Shields, Philip A and Bruckbauer, Jochen and Trager-Cowan, Carol (2023) Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction. Microscopy and Microanalysis, 29 (6). pp. 1879-1888. ISSN 1431-9276

2022

Khudhur, Faisal W. K. and Macente, Alice and MacDonald, John M. and Daly, Luke (2022) Image-based analysis of weathered slag for calculation of transport properties and passive carbon capture. Microscopy and Microanalysis, 28 (5). pp. 1514-1525. ISSN 1431-9276

Hunter, Daniel A. and Lavery, Samuel P. and Edwards, Paul R. and Martin, Robert W. (2022) Assessing the impact of secondary fluorescence on X-ray microanalysis results from semiconductor thin films : X-ray microanalysis of thin surface films and coatings. Microscopy and Microanalysis, 28 (5). pp. 1472-1483. ISSN 1431-9276

2021

Spasevski, Lucia and Buse, Ben and Edwards, Paul R. and Hunter, Daniel A. and Enslin, Johannes and Foronda, Humberto M. and Wernicke, Tim and Mehnke, Frank and Parbrook, Peter J. and Kneissl, Michael and Martin, Robert W. (2021) Quantification of trace-level silicon doping in AlxGa1–xN films using wavelength-dispersive X-ray microanalysis. Microscopy and Microanalysis, 27 (4). pp. 696-704. ISSN 1431-9276

2019

Pascal, Elena and Hourahine, Ben and Trager-Cowan, Carol and De Graef, Marc (2019) Two beam toy model for dislocation contrast in ECCI. Microscopy and Microanalysis, 25 (S2). pp. 1968-1969.

2018

Edwards, Paul R. and Naresh-Kumar, G. and Kusch, Gunnar and Bruckbauer, Jochen and Spasevski, Lucia and Brasser, Catherine G. and Wallace, Michael J. and Trager-Cowan, Carol and Martin, Robert W. (2018) You do what in your microprobe?! The EPMA as a multimode platform for nitride semiconductor characterization. Microscopy and Microanalysis, 24 (S1). pp. 2026-2027. ISSN 1431-9276

Humphreys, Colin J. and Massabuau, Fabien C-P. and Rhode, Sneha L. and Horton, Matthew K. and O'Hanlon, Thomas J. and Kovacs, Andras and Zielinski, Marcin S. and Kappers, Menno J. and Dunin-Borkowski, Rafal E. and Oliver, Rachel A. (2018) Atomic resolution imaging of dislocations in algan and the efficiency of UV LEDs. Microscopy and Microanalysis, 24 (S1). pp. 4-5. ISSN 1431-9276

2017

Pascal, Elena and Singh, Saransh and Hourahine, Ben and Trager-Cowan, Carol and De Graef, Marc (2017) Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns. Microscopy and Microanalysis, 23 (S1). pp. 540-541. ISSN 1431-9276

2016

Tragardh, Johanna and Murtagh, Michelle and Robb, Gillian and Parsons, Maddy and Lin, Jipeng and Spence, David J. and McConnell, Gail (2016) Two-color, two-photon imaging at long excitation wavelengths using a diamond Raman laser. Microscopy and Microanalysis. ISSN 1431-9276

2015

Carvalho, Daniel and Morales, Francisco M. and Ben, Teresa and García, Rafael and Redondo-Cubero, Andrés and Alves, Eduardo and Lorenz, Katharina and Edwards, Paul R. and O'Donnell, Kevin P. and Wetzel, Christian (2015) Quantitative chemical mapping of InGaN quantum wells from calibrated high-angle annular dark field micrographs. Microscopy and Microanalysis, 21 (4). pp. 994-1005. ISSN 1431-9276

2014

Trager-Cowan, C. and Naresh-Kumar, G. and Allehiani, N. and Kraeusel, S. and Hourahine, B. and Vespucci, S. and Thomson, D. and Bruckbauer, J. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mauder, C. and Day, A. P. and Winkelmann, A. and Vilalta-Clemente, A. and Wilkinson, A. J. and Parbrook, P. J. and Kappers, M. J. and Moram, M. A. and Oliver, R. A. and Humphreys, C. J. and Shields, P. and Le Boulbar, E. D. and Maneuski, D. and O'Shea, V. and Mingard, K. P. (2014) Electron channeling contrast imaging of defects in III-nitride semiconductors. Microscopy and Microanalysis, 20 (S3). pp. 1024-1025. ISSN 1435-8115

Edwards, Paul R. and Wallace, Michael J. and Kusch, Gunnar and Naresh-Kumar, Gunasekar and Bruckbauer, Jochen and Trager-Cowan, Carol and O'Donnell, Kevin P. and Martin, Robert W. (2014) Cathodoluminescence hyperspectral imaging of nitride semiconductors : introducing new variables. Microscopy and Microanalysis, 20 (S3). pp. 906-907. ISSN 1435-8115

Naresh-Kumar, G. and Bruckbauer, J. and Edwards, P. R. and Kraeusel, S. and Hourahine, B. and Martin, R. W. and Kappers, M. J. and Moram, M. A. and Lovelock, S. and Oliver, R. A. and Humphreys, C. J. and Trager-Cowan, C. (2014) Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN. Microscopy and Microanalysis, 20 (1). pp. 55-60. ISSN 1431-9276

2012

Edwards, Paul R. and Krishnan Jagadamma, Lethy and Bruckbauer, Jochen and Liu, Chaowang and Shields, Philip and Allsopp, Duncan and Wang, Tao and Martin, Robert W. (2012) High-resolution cathodoluminescence hyperspectral imaging of nitride nanostructures. Microscopy and Microanalysis, 18 (6). pp. 1212-1219. ISSN 1431-9276

McConnell, Gail (2012) Electron microscopic measurement of the size of the optical focus in laser scanning microscopy. Microscopy and Microanalysis, 18 (3). pp. 596-602. ISSN 1431-9276

Trager-Cowan, Carol and Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Bruckbauer, Jochen and Martin, Robert and Mauder, Christof and Day, Austin and England, Gordon and Winkelmann, Aimo and Parbrook, Peter and Wilkinson, Anjus (2012) Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films. Microscopy and Microanalysis, 18 (S2). pp. 684-685. ISSN 1431-9276

2008

Smith, R.W. and Robinson, J.P. and Zucker, R.M. and Geddes, C.D. and Kachelmeier, A. and McConnell, G. and Merrifield, C. and Murphy, R. (2008) Perspectives on cellular analysis: linking quantitation to structure and function by instrumental methods and analysis. Microscopy and Microanalysis, 14 (Supple). pp. 752-753. ISSN 1431-9276