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2024

Hunter, Daniel A. and Naresh-Kumar, Gunasekar and Edwards, Paul R. and Makydonska, Olha and Massabuau, Fabien C. P. and Hatipoglu, Isa and Mukhopadhyay, Partha and Schoenfeld, Winston V. and Martin, Robert W. (2024) Tin gallium oxide epilayers on different substrates : optical and compositional analysis. Physica Status Solidi B, 261 (10). 2400137. ISSN 0370-1972

Edwards, Paul R and Kumar, G Naresh and McKendry, Jonathan J D and Xie, Enyuan and Gu, Erdan and Dawson, Martin D and Martin, Robert W (2024) Simultaneous mapping of cathodoluminescence spectra and backscatter diffraction patterns in a scanning electron microscope. Nanotechnology, 35 (39). 395704. ISSN 0957-4484

Eling, Charlotte J. and Bruce, Natalie and Gunasekar, Naresh-Kumar and Alves, Pedro Urbano and Edwards, Paul R. and Martin, Robert W. and Laurand, Nicolas (2024) Biotinylated photocleavable semiconductor colloidal quantum dot supraparticle microlaser. ACS Applied Nano Materials, 7 (8). pp. 9159-9166. ISSN 2574-0970

2022

Eling, Charlotte and Gunasekar, Naresh and Edwards, Paul and Martin, Robert and Laurand, Nicolas; (2022) Silica coated colloidal semiconductor quantum dot supracrystal microlasers. In: 2022 IEEE Photonics Conference (IPC). IEEE Photonics Conference (IPC) . IEEE, Piscataway. N.J.. ISBN 9781665434874

Mukhopadhyay, Partha and Hatipoglu, Isa and Frodason, Ymir K. and Varley, Joel B. and Williams, Martin S. and Hunter, Daniel A. and Gunasekar, Naresh K. and Edwards, Paul R. and Martin, Robert W. and Wu, Feng and Mauze, Akhil and Speck, James S. and Schoenfeld, Winston V. (2022) Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE. Applied Physics Letters, 121 (11). 111105. ISSN 0003-6951

Eling, Charlotte J. and Gunasekar, Naresh-Kumar and Edwards, Paul R. and Martin, Robert W. and Laurand, Nicolas (2022) Silica coated colloidal semiconductor quantum dot supracrystal microlasers. In: Quantum Dot Day, 2022-03-28.

Naresh-Kumar, G. and Edwards, P. R. and Batten, T. and Nouf-Allehiani, M. and Vilalta-Clemente, A. and Wilkinson, A. J. and Le Boulbar, E. and Shields, P. A. and Starosta, B. and Hourahine, B. and Martin, R. W. and Trager-Cowan, C. (2022) Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy. Journal of Applied Physics, 131 (7). 075303. ISSN 0021-8979

2021

Hatipoglu, Isa and Hunter, Daniel A. and Mukhopadhyay, Partha and Williams, Martin S. and Edwards, Paul R. and Martin, Robert W. and Schoenfeld, Winston V. and Gunasekar, G. Naresh (2021) Correlation between deep-level defects and functional properties of β-(SnxGa1-x)2O3 on Si photodetectors. Journal of Applied Physics, 130 (20). 204501. ISSN 0021-8979

Mukhopadhyay, Partha and Hatipoglu, Isa and Sakthivel, Tamil Selvan and Hunter, Daniel A. and Gunasekar, Naresh Kumar and Edwards, Paul R. and Martin, Robert W. and Seal, Sudipta and Schoenfeld, Winston Vaughan (2021) High figure‐of‐merit gallium oxide UV photodetector on silicon by molecular beam epitaxy : a path toward monolithic integration. Advanced Photonics Research, 2 (4). 2000067.

Naresh-Kumar, Gunasekar and Macintyre, Hazel and Shanthi, Shanthi and Edwards, Paul R. and Martin, Robert W. and Daivasigamani, Krishnamurthy and Sasaki, Kohei and Kuramata, Akito (2021) Origin of red emission in β-Ga2O3 analysed by cathodoluminescence and photoluminescence spectroscopy. Physica Status Solidi B, 258. 2000465. ISSN 0370-1972

2020

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Jablon, B. M. and Johnston, R. and Martin, R. W. and McDermott, R. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Pascal, E. and Thomson, D. and Vespucci, S. and Mingard, K. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Knauer, A. and Hagedorn, S. and Walde, S. and Weyers, M. and Coulon, P-M and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Y. and Smith, R. M. and Wang, T. and Winkelmann, A. (2020) Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope. IOP Conference Series: Materials Science and Engineering, 891 (1). 012023. ISSN 1757-899X

Naresh-Kumar, G. and Alasamari, A. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mingard, K. P. and Trager-Cowan, C. (2020) Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope. Ultramicroscopy, 213. 112977. ISSN 0304-3991

Trager-Cowan, Carol and Alasmari, Aeshah and Avis, William and Bruckbauer, Jochen and Edwards, Paul R and Ferenczi, Gergely and Hourahine, Benjamin and Kotzai, Almpes and Kraeusel, Simon and Kusch, Gunnar and Martin, Robert W and McDermott, Ryan and Gunasekar, Naresh and Nouf-Allehiani, M. and Pascal, Elena and Thomson, David and Vespucci, Stefano and Smith, Matthew David and Parbrook, Peter J and Enslin, Johannes and Mehnke, Frank and Kuhn, Christian and Wernicke, Tim and Kneissl, Michael and Hagedorn, Sylvia and Knauer, Arne and Walde, Sebastian and Weyers, Markus and Coulon, Pierre-Marie and Shields, Philip and Bai, J. and Gong, Y. and Jiu, Ling and Zhang, Y. and Smith, Richard and Wang, Tao and Winkelmann, Aimo (2020) Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope. Semiconductor Science and Technology, 35 (5). 054001. ISSN 0268-1242

Jablon, B.M. and Mingard, K. and Winkelmann, A. and Naresh-Kumar, G. and Hourahine, B. and Trager-Cowan, C. (2020) Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging. International Journal of Refractory Metals and Hard Materials, 87. 105159. ISSN 0263-4368

Walde, S. and Hagedorn, S. and Coulon, P.-M. and Mogilatenko, A. and Netzel, C. and Weinrich, J. and Susilo, N. and Ziffer, E. and Matiwe, L. and Hartmann, C. and Kusch, G. and Alasmari, A. and Naresh-Kumar, G. and Trager-Cowan, C. and Wernicke, T. and Straubinger, T. and Bickermann, M. and Martin, R. W. and Shields, P. A. and Kneissl, M. and Weyers, M. (2020) AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy. Journal of Crystal Growth, 531. 125343. ISSN 0022-0248

Bruckbauer, Jochen and Trager-Cowan, Carol and Hourahine, Ben and Winkelmann, Aimo and Vennéguès, Philippe and Ipsen, Anja and Yu, Xiang and Zhao, Xunming and Wallace, Michael J. and Edwards, Paul R. and Naresh-Kumar, G. and Hocker, Matthias and Bauer, Sebastian and Müller, Raphael and Bai, Jie and Thonke, Klaus and Wang, Tao and Martin, Robert W. (2020) Luminescence behavior of semipolar (10-11) InGaN/GaN "bow-tie" structures on patterned Si substrates. Journal of Applied Physics, 127 (3). 035705. ISSN 0021-8979

2019

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Johnston, R. and Naresh-Kumar, G. and Martin, R. W. and Nouf-Allehiani, M. and Pascal, E. and Spasevski, L. and Thomson, D. and Vespucci, S. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Hagedorn, S. and Knauer, A. and Kueller, V. and Walde, S. and Weyers, M. and Coulon, P.-M. and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Yipin and Smith, R. M. and Wang, T. and Winkelmann, A. (2019) Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research, 7 (11). B73-B82. ISSN 2327-9125

Naresh-Kumar, G. and Bruckbauer, J. and Winkelmann, A. and Yu, X. and Hourahine, B. and Edwards, P. R. and Wang, T. and Trager-Cowan, C. and Martin, R. W. (2019) Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope. Nano Letters, 19 (6). pp. 3863-3870. ISSN 1530-6992

2018

Naresh-Kumar, G. and Thomson, David and Zhang, Y. and Bai, J. and Jiu, L. and Yu, X. and Gong, Y. P. and Martin, Richard Smith and Wang, Tao and Trager-Cowan, Carol (2018) Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging. Journal of Applied Physics, 124 (6). 065301. ISSN 0021-8979

Edwards, Paul R. and Naresh-Kumar, G. and Kusch, Gunnar and Bruckbauer, Jochen and Spasevski, Lucia and Brasser, Catherine G. and Wallace, Michael J. and Trager-Cowan, Carol and Martin, Robert W. (2018) You do what in your microprobe?! The EPMA as a multimode platform for nitride semiconductor characterization. Microscopy and Microanalysis, 24 (S1). pp. 2026-2027. ISSN 1431-9276

Pascal, E. and Hourahine, B. and Naresh-Kumar, G. and Mingard, K. and Trager-Cowan, C. (2018) Dislocation contrast in electron channelling contrast images as projections of strain-like components. Materials Today: Proceedings, 5 (Issue ). 14652–14661. ISSN 2214-7853

2017

Naresh-Kumar, G. and Vilalta-Clemente, A. and Jussila, H. and Winkelmann, A. and Nolze, G. and Vespucci, S. and Nagarajan, S. and Wilkinson, A.J. and Trager-Cowan, C. (2017) Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction. Scientific Reports, 7. 10916. ISSN 2045-2322

Bruckbauer, Jochen and Li, Zhi and Naresh-Kumar, G. and Warzecha, Monika and Edwards, Paul R. and Jiu, Ling and Gong, Yipin and Bai, Jie and Wang, Tao and Trager-Cowan, Carol and Martin, Robert W. (2017) Spatially-resolved optical and structural properties of semi-polar (11-22) AlxGa1-xN with x up to 0.56. Scientific Reports, 7. 10804. ISSN 2045-2322

Le Boulbar, E. D. and Priesol, J. and Nouf-Allehiani, M. and Naresh-Kumar, G. and Fox, S. and Trager-Cowan, C. and Šatka, A. and Allsopp, D. W. E. and Shields, P. A. (2017) Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes. Journal of Crystal Growth. pp. 30-38. ISSN 0022-0248

Winkelmann, A. and Nolze, G. and Vespucci, S. and Gunasekar, N. and Trager-Cowan, C. and Vilalta-Clemente, A. and Wilkinson, A. J. and Vos, M. (2017) Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications. Journal of Microscopy. ISSN 0022-2720

Vespucci, S. and Naresh-Kumar, G. and Trager-Cowan, C. and Mingard, K. P. and Maneuski, D. and O'Shea, V. and Winkelmann, A. (2017) Diffractive triangulation of radiative point sources. Applied Physics Letters, 110 (12). 124103. ISSN 0003-6951

Vilalta-Clemente, A. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Gamarra, P. and di Forte-Poisson, M.A. and Trager-Cowan, C. and Wilkinson, A.J. (2017) Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films. Acta Materialia, 125. pp. 125-135. ISSN 1359-6454

Smith, M. D. and Thomson, D. and Zubialevich, V. Z. and Li, H. and Naresh-Kumar, G. and Trager-Cowan, C. and Parbrook, P. J. (2017) Nanoscale fissure formation in AlxGa1–xN/GaN heterostructures and their influence on Ohmic contact formation. Physica Status Solidi A, 214 (1). 1600353. ISSN 1862-6300

2016

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R. W. and Trager-Cowan, C. (2016) Reprint of : Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 55. pp. 19-25. ISSN 1369-8001

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R.W. and Trager-Cowan, C. (2016) Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 47. pp. 44-50. ISSN 1369-8001

2015

Vespucci, S. and Winkelmann, A. and Naresh-Kumar, G. and Mingard, K. P. and Maneuski, D. and Edwards, P. R. and Day, A. P. and O'Shea, V. and Trager-Cowan, C. (2015) Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns. Physical Review B (Condensed Matter), 92 (20). 205301. ISSN 0163-1829

Kusch, Gunnar and Nouf-Allehiani, M. and Mehnke, Frank and Kuhn, Christian and Edwards, Paul R. and Wernicke, Tim and Knauer, Arne and Kueller, Viola and Naresh-Kumar, G. and Weyers, Markus and Kneissl, Michael and Trager-Cowan, Carol and Martin, Robert W. (2015) Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N. Applied Physics Letters, 107 (7). 072103. ISSN 0003-6951

2014

Naresh-Kumar, G. and Vilalta-Clemente, A. and Pandey, S. and Skuridina, D. and Behmenburg, H. and Gamarra, P. and Patriarche, G. and Vickridge, I. and di Forte-Poisson, M. A. and Vogt, P. and Kneissl, M. and Morales, M. and Ruterana, P. and Cavallini, A. and Cavalcoli, D. and Giesen, C. and Heuken, M. and Trager-Cowan, C. (2014) Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors. AIP Advances, 4 (12). 127101. ISSN 2158-3226

Trager-Cowan, C. and Naresh-Kumar, G. and Allehiani, N. and Kraeusel, S. and Hourahine, B. and Vespucci, S. and Thomson, D. and Bruckbauer, J. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mauder, C. and Day, A. P. and Winkelmann, A. and Vilalta-Clemente, A. and Wilkinson, A. J. and Parbrook, P. J. and Kappers, M. J. and Moram, M. A. and Oliver, R. A. and Humphreys, C. J. and Shields, P. and Le Boulbar, E. D. and Maneuski, D. and O'Shea, V. and Mingard, K. P. (2014) Electron channeling contrast imaging of defects in III-nitride semiconductors. Microscopy and Microanalysis, 20 (S3). pp. 1024-1025. ISSN 1435-8115

Edwards, Paul R. and Wallace, Michael J. and Kusch, Gunnar and Naresh-Kumar, Gunasekar and Bruckbauer, Jochen and Trager-Cowan, Carol and O'Donnell, Kevin P. and Martin, Robert W. (2014) Cathodoluminescence hyperspectral imaging of nitride semiconductors : introducing new variables. Microscopy and Microanalysis, 20 (S3). pp. 906-907. ISSN 1435-8115

Naresh-Kumar, G. and Bruckbauer, J. and Edwards, P. R. and Kraeusel, S. and Hourahine, B. and Martin, R. W. and Kappers, M. J. and Moram, M. A. and Lovelock, S. and Oliver, R. A. and Humphreys, C. J. and Trager-Cowan, C. (2014) Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN. Microscopy and Microanalysis, 20 (1). pp. 55-60. ISSN 1431-9276

2013

Naresh Kumar, G. and Mauder, C and Wang, K.R. and Kraeusel, Simon and Bruckbauer, Jochen and Edwards, P. R. and Hourahine, Benjamin and Kalisch, H. and Vescan, A. and Giesen, C. and Heuken, M and Trampert, A. and Day, A.P. and Trager-Cowan, Carol (2013) Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope. Applied Physics Letters, 102 (14). 142103. ISSN 0003-6951

Nagarajan, S. and Svensk, O. and Ali, M. and Naresh-Kumar, G. and Trager-Cowan, Carol and Suihkonen, S. and Sopanen, M. and Lipsanen, H. (2013) Stress distribution of GaN layer grown on micro-pillar patterned GaN templates. Applied Physics Letters, 103 (1). 012102. ISSN 0003-6951

2012

Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Day, A.P. and Winkelmann, Aimo and Wilkinson, A.J. and Parbrook, P.J. and England, G. and Trager-Cowan, Carol (2012) Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. Physical Review Letters, 108 (13). 135503. ISSN 1079-7114

Naresh-Kumar, G. and Hourahine, Benjamin and Vilalta-Clemente, A. and Ruterana, P. and Gamarra, P. and Lacam, C. and Tordjman, M. and Forte-Poisson, M. A. di and Parbrook, P. J. and Day, A. P. and England, G. and Trager-Cowan, Carol (2012) Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope. Physica Status Solidi A, 209 (3). pp. 424-426. ISSN 1862-6300

Trager-Cowan, Carol and Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Bruckbauer, Jochen and Martin, Robert and Mauder, Christof and Day, Austin and England, Gordon and Winkelmann, Aimo and Parbrook, Peter and Wilkinson, Anjus (2012) Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films. Microscopy and Microanalysis, 18 (S2). pp. 684-685. ISSN 1431-9276