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Being more open: International Open Access Week at Strathprints (19-25 Oct 2020)...

Strathprints makes available scholarly Open Access content by researchers from the University of Strathclyde, spanning numerous disciplines across science, engineering, business, social sciences and humanties. 19-25 October 2020 is International Open Access Week, an annual global event to promote the need for, and benefits of, greater Open Access in scholarship. This not only encompasses greater openness of research publications like journal articles and conference papers, but also important outputs of the research process, such as data (e.g. Open Data).

At Strathclyde we are committed to progressing towards full Open Access by 2025. That is why close to 90% of all research is now made available Open Access, principally through Strathprints. Explore all of Strathclyde's Open Access research...

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Jump to: 2021 | 2016

Number of items: 4.

2021

Sulimov, M. A. and Sarychev, M. N. and Yakushev, M. V. and Márquez-Prieto, J. and Forbes, I. and Ivanov, V. Yu. and Edwards, P. R. and Mudryi, A. V. and Krustok, J. and Martin, R. W. (2021) Effects of irradiation of ZnO/CdS/Cu2ZnSnSe4/Mo/glass solar cells by 10 MeV electrons on photoluminescence spectra. Materials Science in Semiconductor Processing, 121. 105301. ISSN 1369-8001

2016

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R. W. and Trager-Cowan, C. (2016) Reprint of : Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 55. pp. 19-25. ISSN 1369-8001

Zare Chavoshi, Saeed and Xu, Shuzhi and Luo, Xichun (2016) Dislocation-mediated plasticity in silicon during nanometric cutting : a molecular dynamics simulation study materials science in semiconductor processing. Materials Science in Semiconductor Processing, 51. pp. 60-70. ISSN 1369-8001

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R.W. and Trager-Cowan, C. (2016) Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 47. pp. 44-50. ISSN 1369-8001

This list was generated on Fri Oct 30 01:48:33 2020 GMT.