Browse by Journal or other publication

2026

Ge, Peiqi and Cao, Zhecan and Li, Zongqiang and Wang, Peizhi and Bi, Wenbo and Ge, Mengran and Xie, Wenkun and Xing, Xu (2026) Progress and critical challenges in slicing of thin semiconductor wafers using ultra-fine diamond wire. Materials Science in Semiconductor Processing, 203. 110209. ISSN 1369-8001

2025

Park, Se-Rim and Chi, Zeyu and Sartel, Corinne and Koo, sang-Mo and Fregnaux, Matthieu and Zheng, Yunlin and Douglas, Sean and Penman, Lewis and Massabuau, Fabien and Tchelidze, Tamar and Chauveau, Jean-Michel and Chikoidze, Ekaterine (2025) Effect of oxygen content on p-type electrical conductivity in β-Ga2O3 films. Materials Science in Semiconductor Processing, 200. 110003. ISSN 1873-4081

2021

Fan, Pengfei and Goel, Saurav and Luo, Xichun and Yan, Yongda and Geng, Yanquan and He, Yang and Wang, Yuzhang (2021) Molecular dynamics simulation of AFM tip-based hot scratching of nanocrystalline GaAs. Materials Science in Semiconductor Processing, 130. 105832. ISSN 1369-8001

Sulimov, M. A. and Sarychev, M. N. and Yakushev, M. V. and Márquez-Prieto, J. and Forbes, I. and Ivanov, V. Yu. and Edwards, P. R. and Mudryi, A. V. and Krustok, J. and Martin, R. W. (2021) Effects of irradiation of ZnO/CdS/Cu2ZnSnSe4/Mo/glass solar cells by 10 MeV electrons on photoluminescence spectra. Materials Science in Semiconductor Processing, 121. 105301. ISSN 1369-8001

2016

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R. W. and Trager-Cowan, C. (2016) Reprint of : Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 55. pp. 19-25. ISSN 1369-8001

Zare Chavoshi, Saeed and Xu, Shuzhi and Luo, Xichun (2016) Dislocation-mediated plasticity in silicon during nanometric cutting : a molecular dynamics simulation study materials science in semiconductor processing. Materials Science in Semiconductor Processing, 51. pp. 60-70. ISSN 1369-8001

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R.W. and Trager-Cowan, C. (2016) Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 47. pp. 44-50. ISSN 1369-8001