Space craft photographed floating in low earth orbit

Open Access research: Conquering challenges in, and from, space...

Strathclyde researchers are highly active in the areas of space systems, astronautics, space science, and space mechatronics. Researchers from Physics within the Centre for Space Science and Applications, the Aerospace Centre of Excellence in MAE, the Space Mechatronic Systems Technology (SMeSTech) Laboratory within DMEM, and researchers in EEE, all explore the engineering and scientific challenges within space, with topics such as spaceflight mechanics, robotics for in-orbit satellite services and refuelling, and satellite-based ocean colour remote sensing, among many others.

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Strathprints

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Jump to: 2021 | 2016
Number of items: 5.

2021

Fan, Pengfei and Goel, Saurav and Luo, Xichun and Yan, Yongda and Geng, Yanquan and He, Yang and Wang, Yuzhang (2021) Molecular dynamics simulation of AFM tip-based hot scratching of nanocrystalline GaAs. Materials Science in Semiconductor Processing. ISSN 1369-8001 (In Press)

Sulimov, M. A. and Sarychev, M. N. and Yakushev, M. V. and Márquez-Prieto, J. and Forbes, I. and Ivanov, V. Yu. and Edwards, P. R. and Mudryi, A. V. and Krustok, J. and Martin, R. W. (2021) Effects of irradiation of ZnO/CdS/Cu2ZnSnSe4/Mo/glass solar cells by 10 MeV electrons on photoluminescence spectra. Materials Science in Semiconductor Processing, 121. 105301. ISSN 1369-8001

2016

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R. W. and Trager-Cowan, C. (2016) Reprint of : Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 55. pp. 19-25. ISSN 1369-8001

Zare Chavoshi, Saeed and Xu, Shuzhi and Luo, Xichun (2016) Dislocation-mediated plasticity in silicon during nanometric cutting : a molecular dynamics simulation study materials science in semiconductor processing. Materials Science in Semiconductor Processing, 51. pp. 60-70. ISSN 1369-8001

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R.W. and Trager-Cowan, C. (2016) Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 47. pp. 44-50. ISSN 1369-8001

This list was generated on Tue Dec 7 15:35:27 2021 GMT.