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Open Access research that pushes advances in hyperspectral imaging...

Strathprints makes available scholarly Open Access content by researchers in the Department of Electronic & Electrical Engineering (EEE), based within the Faculty of Engineering.

EEE hosts the Centre for Signal & Image Processing (CeSIP) which harnesses techniques to address a series of imaging processing problems within biological, astronomical and hyperspectral imaging applications. The wider Department also demonstrates specialisms including sustainable energy systems, telecommunications network advances, electro-technological solutions to public health issues, as well as power networks and smart grids.

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Group by: Publication Date | Item type | No Grouping
Jump to: 2019 | 2018 | 2017 | 2016 | 2014
Number of items: 5.

2019

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, Jochen and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Johnston, R. and Naresh-Kumar, G. and Martin, R. W. and Nouf-Allehiani, M. and Pascal, E. and Spasevski, L. and Thomson, D. and Vespucci, S. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Hagedorn, S. and Walde, S. and Weyers, M. and Coulon, P.-M. and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Y. P. and Smith, R. M. and Wang, T. and Winkelmann, A. (2019) The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research. ISSN 2327-9125 (In Press)

2018

Naresh-Kumar, G. and Thomson, David and Zhang, Y. and Bai, J. and Jiu, L. and Yu, X. and Gong, Y. P. and Martin, Richard Smith and Wang, Tao and Trager-Cowan, Carol (2018) Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging. Journal of Applied Physics, 124 (6). ISSN 0021-8979

2017

Smith, M. D. and Thomson, D. and Zubialevich, V. Z. and Li, H. and Naresh-Kumar, G. and Trager-Cowan, C. and Parbrook, P. J. (2017) Nanoscale fissure formation in AlxGa1–xN/GaN heterostructures and their influence on Ohmic contact formation. Physica Status Solidi A, 214 (1). ISSN 1862-6300

2016

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R.W. and Trager-Cowan, C. (2016) Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 47. pp. 44-50. ISSN 1369-8001

2014

Trager-Cowan, C. and Naresh-Kumar, G. and Allehiani, N. and Kraeusel, S. and Hourahine, B. and Vespucci, S. and Thomson, D. and Bruckbauer, J. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mauder, C. and Day, A. P. and Winkelmann, A. and Vilalta-Clemente, A. and Wilkinson, A. J. and Parbrook, P. J. and Kappers, M. J. and Moram, M. A. and Oliver, R. A. and Humphreys, C. J. and Shields, P. and Le Boulbar, E. D. and Maneuski, D. and O'Shea, V. and Mingard, K. P. (2014) Electron channeling contrast imaging of defects in III-nitride semiconductors. Microscopy and Microanalysis, 20 (S3). pp. 1024-1025. ISSN 1435-8115

This list was generated on Mon Oct 14 19:22:55 2019 BST.