Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Johnston, R. and Naresh-Kumar, G. and Martin, R. W. and Nouf-Allehiani, M. and Pascal, E. and Spasevski, L. and Thomson, D. and Vespucci, S. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Hagedorn, S. and Knauer, A. and Kueller, V. and Walde, S. and Weyers, M. and Coulon, P.-M. and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Yipin and Smith, R. M. and Wang, T. and Winkelmann, A. (2019) Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research, 7 (11). B73-B82. ISSN 2327-9125

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    Abstract

    In this paper we describe the scanning electron microscopy techniques of electron backscatter diffraction, electron channeling contrast imaging, wavelength dispersive X-ray spectroscopy, and cathodoluminescence hyperspectral imaging. We present our recent results on the use of these non-destructive techniques to obtain information on the topography, crystal misorientation, defect distributions, composition, doping, and light emission from a range of UV-emitting nitride semiconductor structures. We aim to illustrate the developing capability of each of these techniques for understanding the properties of UV-emitting nitride semiconductors, and the benefits were appropriate, in combining the techniques.

    Creators(s): Trager-Cowan, C. ORCID logoORCID: https://orcid.org/0000-0001-8684-7410, Alasmari, A. ORCID logoORCID: https://orcid.org/0000-0002-2393-6253, Avis, W., Bruckbauer, J. ORCID logoORCID: https://orcid.org/0000-0001-9236-9320, Edwards, P. R. ORCID logoORCID: https://orcid.org/0000-0001-7671-7698, Hourahine, B. ORCID logoORCID: https://orcid.org/0000-0002-7667-7101, Kraeusel, S., Kusch, G. ORCID logoORCID: https://orcid.org/0000-0003-2743-1022, Johnston, R., Naresh-Kumar, G. ORCID logoORCID: https://orcid.org/0000-0002-9642-8137, Martin, R. W. ORCID logoORCID: https://orcid.org/0000-0002-6119-764X, Nouf-Allehiani, M. ORCID logoORCID: https://orcid.org/0000-0002-4338-1048, Pascal, E. ORCID logoORCID: https://orcid.org/0000-0002-6785-986X, Spasevski, L., Thomson, D. ORCID logoORCID: https://orcid.org/0000-0003-4900-5307, Vespucci, S. ORCID logoORCID: https://orcid.org/0000-0002-1981-339X, Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F., Kneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Yipin, Smith, R. M., Wang, T. and Winkelmann, A.;
    Item type:Article
    ID code:69913
    Keywords:scanning electron microscopy, electron backscatter diffraction, non-destructive techniques, UV emitting nitride semiconductors, Physics, Atomic and Molecular Physics, and Optics
    Subjects:Science > Physics
    Department:Technology and Innovation Centre > Photonics
    Faculty of Science > Physics
    Strategic Research Themes > Measurement Science and Enabling Technologies
    Technology and Innovation Centre > Bionanotechnology
    Depositing user: Pure Administrator
    Date deposited:24 Sep 2019 09:12
    Last modified:25 Feb 2020 02:20
    Related URLs:
    URI:https://strathprints.strath.ac.uk/id/eprint/69913
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