Electron channeling contrast imaging of defects in III-nitride semiconductors

Trager-Cowan, C. and Naresh-Kumar, G. and Allehiani, N. and Kraeusel, S. and Hourahine, B. and Vespucci, S. and Thomson, D. and Bruckbauer, J. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mauder, C. and Day, A. P. and Winkelmann, A. and Vilalta-Clemente, A. and Wilkinson, A. J. and Parbrook, P. J. and Kappers, M. J. and Moram, M. A. and Oliver, R. A. and Humphreys, C. J. and Shields, P. and Le Boulbar, E. D. and Maneuski, D. and O'Shea, V. and Mingard, K. P. (2014) Electron channeling contrast imaging of defects in III-nitride semiconductors. Microscopy and Microanalysis, 20 (S3). pp. 1024-1025. ISSN 1435-8115 (https://doi.org/10.1017/S1431927614006849)

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Trager-Cowan, C. ORCID logoORCID: https://orcid.org/0000-0001-8684-7410, Naresh-Kumar, G. ORCID logoORCID: https://orcid.org/0000-0002-9642-8137, Allehiani, N. ORCID logoORCID: https://orcid.org/0000-0002-4338-1048, Kraeusel, S., Hourahine, B. ORCID logoORCID: https://orcid.org/0000-0002-7667-7101, Vespucci, S. ORCID logoORCID: https://orcid.org/0000-0002-1981-339X, Thomson, D. ORCID logoORCID: https://orcid.org/0000-0003-4900-5307, Bruckbauer, J. ORCID logoORCID: https://orcid.org/0000-0001-9236-9320, Kusch, G. ORCID logoORCID: https://orcid.org/0000-0003-2743-1022, Edwards, P. R. ORCID logoORCID: https://orcid.org/0000-0001-7671-7698, Martin, R. W. ORCID logoORCID: https://orcid.org/0000-0002-6119-764X, Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A., Oliver, R. A., Humphreys, C. J., Shields, P., Le Boulbar, E. D., Maneuski, D., O'Shea, V. and Mingard, K. P.;