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2024

Hunter, Daniel A. and Naresh-Kumar, Gunasekar and Edwards, Paul R. and Makydonska, Olha and Massabuau, Fabien C. P. and Hatipoglu, Isa and Mukhopadhyay, Partha and Schoenfeld, Winston V. and Martin, Robert W. (2024) Tin gallium oxide epilayers on different substrates : optical and compositional analysis. Physica Status Solidi B, 261 (10). 2400137. ISSN 0370-1972

2022

Hunter, Daniel A. and Lavery, Samuel P. and Edwards, Paul R. and Martin, Robert W. (2022) Assessing the impact of secondary fluorescence on X-ray microanalysis results from semiconductor thin films : X-ray microanalysis of thin surface films and coatings. Microscopy and Microanalysis, 28 (5). pp. 1472-1483. ISSN 1431-9276

Mukhopadhyay, Partha and Hatipoglu, Isa and Frodason, Ymir K. and Varley, Joel B. and Williams, Martin S. and Hunter, Daniel A. and Gunasekar, Naresh K. and Edwards, Paul R. and Martin, Robert W. and Wu, Feng and Mauze, Akhil and Speck, James S. and Schoenfeld, Winston V. (2022) Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE. Applied Physics Letters, 121 (11). 111105. ISSN 0003-6951

2021

Hatipoglu, Isa and Hunter, Daniel A. and Mukhopadhyay, Partha and Williams, Martin S. and Edwards, Paul R. and Martin, Robert W. and Schoenfeld, Winston V. and Gunasekar, G. Naresh (2021) Correlation between deep-level defects and functional properties of β-(SnxGa1-x)2O3 on Si photodetectors. Journal of Applied Physics, 130 (20). 204501. ISSN 0021-8979

Spasevski, Lucia and Buse, Ben and Edwards, Paul R. and Hunter, Daniel A. and Enslin, Johannes and Foronda, Humberto M. and Wernicke, Tim and Mehnke, Frank and Parbrook, Peter J. and Kneissl, Michael and Martin, Robert W. (2021) Quantification of trace-level silicon doping in AlxGa1–xN films using wavelength-dispersive X-ray microanalysis. Microscopy and Microanalysis, 27 (4). pp. 696-704. ISSN 1431-9276

Mukhopadhyay, Partha and Hatipoglu, Isa and Sakthivel, Tamil Selvan and Hunter, Daniel A. and Gunasekar, Naresh Kumar and Edwards, Paul R. and Martin, Robert W. and Seal, Sudipta and Schoenfeld, Winston Vaughan (2021) High figure‐of‐merit gallium oxide UV photodetector on silicon by molecular beam epitaxy : a path toward monolithic integration. Advanced Photonics Research, 2 (4). 2000067.

Massabuau, F. C.-P. and Roberts, J. W. and Nicol, D. and Edwards, P. R. and McLelland, M. and Dallas, G. L. and Hunter, D. A. and Nicolson, E. A. and Jarman, J. C. and Kovács, A. and Martin, R. W. and Oliver, R. A. and Chalker, P. R.; Rogers, David J. and Look, David C. and Teherani, Ferechteh H., eds. (2021) Progress in atomic layer deposited α-Ga2O3 materials and solar-blind detectors. In: Proceedings Volume 11687, Oxide-based Materials and Devices. Proceedings of SPIE - The International Society for Optical Engineering . Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States. ISBN 9781510642096

2020

Foronda, Humberto M. and Hunter, Daniel A. and Pietsch, Mike and Sulmoni, Luca and Muhin, Anton and Graupeter, Sarina and Susilo, Norman and Schilling, Marcel and Enslin, Johannes and Irmscher, Klaus and Martin, Robert W. and Wernicke, Tim and Kneissl, Michael (2020) Electrical properties of (11-22) Si:AlGaN layers at high Al contents grown by metal-organic vapor phase epitaxy. Applied Physics Letters, 117 (22). 221101. ISSN 0003-6951