Picture of molecule

Open Access research that better understands matter at a molecular level...

Strathprints makes available Open Access scholarly outputs by researchers based within the Department of Chemical & Process Engineering. Key areas of research specialism include the manufacture and application of porous materials and metal-organic frameworks; the properties and processing of polymeric materials; the nucleation, growth and separation of crystals; the applications of electrochemistry to coatings, metal ion recovery, and water clean-up.

Explore some of this Open Access research from Chemical & Process Engineering. Or explore all Strathclyde Open Access research...

Browse by Author or creator

Group by: Publication Date | Item type | No Grouping
Jump to: 2007 | 2006 | 2002 | 2001
Number of items: 9.

2007

Trager-Cowan, C. and Sweeney, F. and Trimby, P. W. and Day, A. P. and Gholinia, A. and Schmidt, N. -H. and Parbrook, P. J. and Wilkinson, A. J. and Watson, I. M. (2007) Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films. Physical Review B, 75 (8). ISSN 1098-0121

Winkelmann, Aimo and Trager-Cowan, Carol and Sweeney, Francis and Day, Austin P. and Parbrook, Peter (2007) Many-Beam Dynamical Simulation of Electron Backscatter Diffraction Patterns. Ultramicroscopy, 107 (2007). pp. 414-421. ISSN 0304-3991

2006

Trager-Cowan, C. and Sweeney, F. and Winkelmann, A. and Wilkinson, A.J. and Trimby, P.W. and Day, A.P. and Gholinia, A. and Schmidt, N.H. and Parbrook, P.J. and Watson, I.M. (2006) Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging. Materials Science and Technology, 22 (11). 1352-1358(7). ISSN 0267-0836

Trager-Cowan, Carol and Sweeney, Francis and Wilkinson, A.J. and Trimby, P.W. and Day, A.P. and Gholinia, A and Schmidt, N.H. and Parbrook, P.J. and Watson, Ian; Kuball, M and Myers, T.H. and Redwing, J.M. and Mukai, T, eds. (2006) Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging. In: GaN, AIN, InN and related materials. Materials research society symposium proceedings . Materials Research Society, USA, pp. 677-682. ISBN 9781558998469

2002

Trager-Cowan, C. and Sweeney, F. and Wilkinson, A.J. and Watson, I.M. and Middleton, P.G. and O'Donnell, K.P. and Zubia, D. and Hersee, S.D. and Einfeldt, S. and Hommel, D. (2002) Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence. Physica Status Solidi C (1). pp. 532-536. ISSN 1610-1642

PEREIRA, SERGIO MANUEL DE SOUSA and Correia, M.R. and Pereira, Eduarda and Trager-Cowan, Carol and Sweeney, Francis and O'Donnell, Kevin and Alves, E. and Franco, N. and Sequeira, A.D. (2002) Structural and optical properties of InGaN/GaN layers close to the critical layer thickness. Applied Physics Letters, 81 (7). p. 1207.

Trager-Cowan, C. and Sweeney, F. and Hastie, J. and Manson-Smith, S.K. and Cowan, D.A. and McColl, D. and Mohammed, A. and O'Donnell, K.P. and Zubia, D. and Hersee, S.D. and Foxon, C.T. and Harrison, I. and Novikov, S.V. (2002) Characterisation of nitride thin films by EBSD. Journal of Microscopy, 205 (3). pp. 226-230. ISSN 0022-2720

2001

Pereira, S. and Correia, M.R. and Pereira, E. and O'Donnell, K.P. and Trager-Cowan, C. and Sweeney, F. and Alves, E. (2001) Compositional pulling effects in InxGa1-x N/GaN layers: A combined depth-resolved cathodoluminescence and Rutherford backscattering/channeling study. Physical Review B: Condensed Matter and Materials Physics, 64 (205311). pp. 205311-1. ISSN 1098-0121

Pereira, S.M.D.S. and Correia, M.R. and Ferreira Pereira Lopes, E.M. and O'Donnell, K.P. and Trager-Cowan, C. and Sweeney, F. and Alves, E. and Sequeira, A.D. and Franco, N. and Watson, I.M. (2001) Depth resolved studies of indium content and strain in InGaN layers. Physica Status Solidi B, 228 (1). pp. 59-64. ISSN 0370-1972

This list was generated on Mon Jan 30 01:35:21 2023 GMT.