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N

Nogales, Emilio and Lorenz, K. and Wang, K and Roqan, I. S. and Martin, R.W. and O'Donnell, K.P. and Alves, E. and Ruffenach, S. and Briot, O.; Kuball, M. and Mukai, T. and Myers, T.H. and Redwing, J.M., eds. (2006) A microspectroscopic study of cap damage in annealed RE-doped AlN-capped GaN. In: GaN, AIN, InN and Related Materials. Materials research society symposium proceedings . Materials Research Society, USA, pp. 625-630. ISBN 9781558998469

R

Roqan, Iman and Trager-Cowan, Carol and Hourahine, Ben and Lorenz, Katharina and Nogales, Emilio and O'Donnell, Kevin P. and Martin, Robert W. and Alves, Eduardo and Ruffenach, S. and Briot, Olivier; Kuball, M. and Mukai, T. and Myers, T.H. and Redwing, J.M., eds. (2006) Characterization of the blue emission of Tm/Er co-implanted GaN. In: GaN, AIN, InN and Related Materials. Materials Research Society Symposium Proceedings . Materials Research Society, USA, pp. 599-604. ISBN 9781558998469

T

Trager-Cowan, Carol and Sweeney, Francis and Wilkinson, A.J. and Trimby, P.W. and Day, A.P. and Gholinia, A and Schmidt, N.H. and Parbrook, P.J. and Watson, Ian; Kuball, M and Myers, T.H. and Redwing, J.M. and Mukai, T, eds. (2006) Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging. In: GaN, AIN, InN and related materials. Materials research society symposium proceedings . Materials Research Society, USA, pp. 677-682. ISBN 9781558998469