Diffractive triangulation of radiative point sources

Vespucci, Stefano and Trager-Cowan, Carol and Maneuski, Dzmitry and O'Shea, Val and Winkelmann, Aimo (2016) Diffractive triangulation of radiative point sources. Working paper. arXiv.org, Ithaca, NY.

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    Abstract

    We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.

    ORCID iDs

    Vespucci, Stefano ORCID logoORCID: https://orcid.org/0000-0002-1981-339X, Trager-Cowan, Carol ORCID logoORCID: https://orcid.org/0000-0001-8684-7410, Maneuski, Dzmitry, O'Shea, Val and Winkelmann, Aimo;