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Number of items: 43.

Article

Nicholson, Stefan and Bruckbauer, Jochen and Edwards, Paul and Trager-Cowan, Carol and Martin, Robert and Ivaturi, Aruna (2024) Unravelling the chloride dopant induced film improvement in all-inorganic perovskite absorbers. Journal of Materials Chemistry. A, 12 (37). pp. 25131-25139. ISSN 2050-7488

Hiller, Kieran P and Winkelmann, Aimo and Hourahine, Ben and Starosta, Bohdan and Alasmari, Aeshah and Feng, Peng and Wang, Tao and Parbrook, Peter J and Zubialevich, Vitaly Z and Hagedorn, Sylvia and Walde, Sebastian and Weyers, Markus and Coulon, Pierre-Marie and Shields, Philip A and Bruckbauer, Jochen and Trager-Cowan, Carol (2023) Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction. Microscopy and Microanalysis, 29 (6). pp. 1879-1888. ISSN 1431-9276

Edwards, Paul R. and Bruckbauer, Jochen and Cameron, Douglas and Martin, Robert W. (2023) Electroluminescence hyperspectral imaging of light-emitting diodes using a liquid crystal tunable filter. Applied Physics Letters, 123 (11). 112110. ISSN 0003-6951

Yang, Hao and Bruckbauer, Jochen and Kanibolotskaya, Lyudmila and Kanibolotsky, Alexander L. and Cameron, Joseph and Wallis, David J. and Martin, Robert W. and Skabara, Peter J. (2023) A cross-linkable, organic down-converting material for white light emission from hybrid LEDs. Journal of Materials Chemistry. C, 11 (29). pp. 9984-9995. ISSN 2050-7526

Birch, Ross and Bruckbauer, Jochen and Gajewska, Marta and Cios, Grzegorz and Pal, Robert and MacKenzie, Lewis E (2023) Influence of polyvinylpyrrolidone (PVP) in the synthesis of luminescent NaYF4:Yb,Er upconversion nanoparticles. Methods and Applications in Fluorescence, 11 (3). 034001. ISSN 2050-6120

Ghosh, Paheli and Bruckbauer, Jochen and Trager-Cowan, Carol and Jagadamma, Lethy Krishnan (2022) Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics. Applied Surface Science, 592. 152865. ISSN 0169-4332

Spasevski, Lucia and Kusch, Gunnar and Pampili, Pietro and Zubialevich, Vitaly Z and Dinh, Duc V and Bruckbauer, Jochen and Edwards, Paul R and Parbrook, Peter J and Martin, Robert W (2021) A systematic comparison of polar and semipolar Si-doped AlGaN alloys with high AlN content. Journal of Physics D: Applied Physics, 54 (3). 035302. ISSN 1361-6463

Bruckbauer, Jochen and Gong, Yipin and Jiu, Ling and Wallace, Michael J and Ipsen, Anja and Bauer, Sebastian and Müller, Raphael and Bai, Jie and Thonke, Klaus and Wang, Tao and Trager-Cowan, Carol and Martin, Robert W (2020) Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (11-20) GaN. Journal of Physics D: Applied Physics, 54 (2). 025107. ISSN 1361-6463

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Jablon, B. M. and Johnston, R. and Martin, R. W. and McDermott, R. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Pascal, E. and Thomson, D. and Vespucci, S. and Mingard, K. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Knauer, A. and Hagedorn, S. and Walde, S. and Weyers, M. and Coulon, P-M and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Y. and Smith, R. M. and Wang, T. and Winkelmann, A. (2020) Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope. IOP Conference Series: Materials Science and Engineering, 891 (1). 012023. ISSN 1757-899X

Zhao, X. and Huang, K. and Bruckbauer, J. and Shen, S. and Zhu, C. and Fletcher, P. and Feng, P. and Cai, Y. and Bai, J. and Trager-Cowan, C. and Martin, R. W. and Wang, T. (2020) Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11–22) green LEDs grown on silicon. Scientific Reports, 10 (1). 12650. ISSN 2045-2322

Trager-Cowan, Carol and Alasmari, Aeshah and Avis, William and Bruckbauer, Jochen and Edwards, Paul R and Ferenczi, Gergely and Hourahine, Benjamin and Kotzai, Almpes and Kraeusel, Simon and Kusch, Gunnar and Martin, Robert W and McDermott, Ryan and Gunasekar, Naresh and Nouf-Allehiani, M. and Pascal, Elena and Thomson, David and Vespucci, Stefano and Smith, Matthew David and Parbrook, Peter J and Enslin, Johannes and Mehnke, Frank and Kuhn, Christian and Wernicke, Tim and Kneissl, Michael and Hagedorn, Sylvia and Knauer, Arne and Walde, Sebastian and Weyers, Markus and Coulon, Pierre-Marie and Shields, Philip and Bai, J. and Gong, Y. and Jiu, Ling and Zhang, Y. and Smith, Richard and Wang, Tao and Winkelmann, Aimo (2020) Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope. Semiconductor Science and Technology, 35 (5). 054001. ISSN 0268-1242

Wiles, Alan A. and Bruckbauer, Jochen and Mohammed, Nabeel and Cariello, Michele and Cameron, Joseph and Findlay, Neil J. and Taylor-Shaw, Elaine and Wallis, David J. and Martin, Robert W. and Skabara, Peter J. and Cooke, Graeme (2020) A poly(urethane)-encapsulated benzo[2,3-d:6,7-d']diimidazole organic down-converter for green hybrid LEDs. Materials Chemistry Frontiers, 4 (3). pp. 1006-1012.

Bruckbauer, Jochen and Trager-Cowan, Carol and Hourahine, Ben and Winkelmann, Aimo and Vennéguès, Philippe and Ipsen, Anja and Yu, Xiang and Zhao, Xunming and Wallace, Michael J. and Edwards, Paul R. and Naresh-Kumar, G. and Hocker, Matthias and Bauer, Sebastian and Müller, Raphael and Bai, Jie and Thonke, Klaus and Wang, Tao and Martin, Robert W. (2020) Luminescence behavior of semipolar (10-11) InGaN/GaN "bow-tie" structures on patterned Si substrates. Journal of Applied Physics, 127 (3). 035705. ISSN 0021-8979

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Johnston, R. and Naresh-Kumar, G. and Martin, R. W. and Nouf-Allehiani, M. and Pascal, E. and Spasevski, L. and Thomson, D. and Vespucci, S. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Hagedorn, S. and Knauer, A. and Kueller, V. and Walde, S. and Weyers, M. and Coulon, P.-M. and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Yipin and Smith, R. M. and Wang, T. and Winkelmann, A. (2019) Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research, 7 (11). B73-B82. ISSN 2327-9125

Naresh-Kumar, G. and Bruckbauer, J. and Winkelmann, A. and Yu, X. and Hourahine, B. and Edwards, P. R. and Wang, T. and Trager-Cowan, C. and Martin, R. W. (2019) Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope. Nano Letters, 19 (6). pp. 3863-3870. ISSN 1530-6992

Angioni, Enrico and Marshall, Ross J. and Findlay, Neil J. and Bruckbauer, Jochen and Breig, Ben and Wallis, David J. and Martin, Robert W. and Forgan, Ross S. and Skabara, Peter J. (2019) Implementing fluorescent MOFs as down-converting layers in hybrid light-emitting diodes. Journal of Materials Chemistry. C, 7 (8). pp. 2394-2400. ISSN 2050-7526

Gong, Y. and Jiu, L. and Bruckbauer, J. and Bai, J. and Martin, R.W. and Wang, T. (2019) Monolithic multiple colour emission from InGaN grown on patterned non-polar GaN. Scientific Reports, 9 (1). 986. ISSN 2045-2322

Edwards, Paul R. and Naresh-Kumar, G. and Kusch, Gunnar and Bruckbauer, Jochen and Spasevski, Lucia and Brasser, Catherine G. and Wallace, Michael J. and Trager-Cowan, Carol and Martin, Robert W. (2018) You do what in your microprobe?! The EPMA as a multimode platform for nitride semiconductor characterization. Microscopy and Microanalysis, 24 (S1). pp. 2026-2027. ISSN 1431-9276

Brasser, C. and Bruckbauer, J. and Gong, Y.P. and Jiu, L. and Bai, J. and Warzecha, M. and Edwards, P. R. and Wang, T. and Martin, R. W. (2018) Cathodoluminescence studies of chevron features in semi-polar (11-22) InGaN/GaN multiple quantum well structures. Journal of Applied Physics, 123. 174502. ISSN 0021-8979

Bruckbauer, Jochen and Li, Zhi and Naresh-Kumar, G. and Warzecha, Monika and Edwards, Paul R. and Jiu, Ling and Gong, Yipin and Bai, Jie and Wang, Tao and Trager-Cowan, Carol and Martin, Robert W. (2017) Spatially-resolved optical and structural properties of semi-polar (11-22) AlxGa1-xN with x up to 0.56. Scientific Reports, 7. 10804. ISSN 2045-2322

Li, Z. and Wang, L. and Jiu, L. and Bruckbauer, J. and Gong, Y. and Zhang, Y. and Bai, J. and Martin, R. W. and Wang, T. (2017) Optical investigation of semi-polar (11-22) AlxGa1-xN with high Al composition. Applied Physics Letters, 110 (9). 091102. ISSN 0003-6951

Taylor-Shaw, Elaine and Angioni, Enrico and Findlay, Neil J. and Breig, Benjamin and Inigo, Anto R. and Bruckbauer, Jochen and Wallis, David J. and Skabara, Peter J. and Martin, Robert W. (2016) Cool to warm white light emission from hybrid inorganic/organic light-emitting diodes. Journal of Materials Chemistry. C, 4 (48). pp. 11499-11507. ISSN 2050-7526

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R. W. and Trager-Cowan, C. (2016) Reprint of : Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 55. pp. 19-25. ISSN 1369-8001

Bruckbauer, Jochen and Brasser, Catherine and Findlay, Neil J. and Edwards, Paul R. and Wallis, David J. and Skabara, Peter J. and Martin, Robert W. (2016) Colour tuning in white hybrid inorganic/organic light-emitting diodes. Journal of Physics D: Applied Physics, 49 (40). 405103. ISSN 1361-6463

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R.W. and Trager-Cowan, C. (2016) Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 47. pp. 44-50. ISSN 1369-8001

Gries, K. I. and Wassner, T. A. and Vogel, S. and Bruckbauer, J. and Häusler, I. and Straubinger, R. and Beyer, A. and Chernikov, A. and Laumer, B. and Kracht, M. and Heiliger, C. and Janek, J. and Chatterjee, S. and Volz, K. and Eickhoff, M. (2015) Self-assembly of ordered wurtzite/rock salt heterostructures—A new view on phase separation in MgxZn1−xO. Journal of Applied Physics, 118 (4). 045706. ISSN 0021-8979

Findlay, Neil J. and Bruckbauer, Jochen and Inigo, Anto R. and Breig, Benjamin and Arumugam, Sasikumar and Wallis, David J. and Martin, Robert W. and Skabara, Peter J. (2014) Light-emitting diodes : an organic down-converting material for white-light emission from hybrid LEDs (Adv. Mater. 43/2014). Advanced Materials, 26 (43). p. 7415. ISSN 1521-4095

Findlay, Neil and Bruckbauer, Jochen and Inigo, Jesuraj and Breig, Benjamin and Arumugam, Sasikumar and Wallis, David J. and Martin, Robert and Skabara, Peter (2014) An organic down-converting material for white-light emission from hybrid LEDs. Advanced Materials, 26 (43). 7290–7294. ISSN 1521-4095

Zhuang, Y. D. and Bruckbauer, J. and Shields, P. A. and Edwards, P. R. and Martin, R. W. and Allsopp, D. W. E. (2014) Influence of stress on optical transitions in GaN nanorods containing a single InGaN/GaN quantum disk. Journal of Applied Physics, 116 (17). 174305. ISSN 0021-8979

Trager-Cowan, C. and Naresh-Kumar, G. and Allehiani, N. and Kraeusel, S. and Hourahine, B. and Vespucci, S. and Thomson, D. and Bruckbauer, J. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mauder, C. and Day, A. P. and Winkelmann, A. and Vilalta-Clemente, A. and Wilkinson, A. J. and Parbrook, P. J. and Kappers, M. J. and Moram, M. A. and Oliver, R. A. and Humphreys, C. J. and Shields, P. and Le Boulbar, E. D. and Maneuski, D. and O'Shea, V. and Mingard, K. P. (2014) Electron channeling contrast imaging of defects in III-nitride semiconductors. Microscopy and Microanalysis, 20 (S3). pp. 1024-1025. ISSN 1435-8115

Edwards, Paul R. and Wallace, Michael J. and Kusch, Gunnar and Naresh-Kumar, Gunasekar and Bruckbauer, Jochen and Trager-Cowan, Carol and O'Donnell, Kevin P. and Martin, Robert W. (2014) Cathodoluminescence hyperspectral imaging of nitride semiconductors : introducing new variables. Microscopy and Microanalysis, 20 (S3). pp. 906-907. ISSN 1435-8115

Bruckbauer, Jochen and Edwards, Paul R and Sahonta, Suman-Lata and Massabuau, Fabien C-P and Kappers, Menno J and Humphreys, Colin J and Oliver, Rachel A and Martin, Robert W (2014) Cathodoluminescence hyperspectral imaging of trench-like defects in InGaN/GaN quantum well structures. Journal of Physics D: Applied Physics, 47 (13). p. 135107. ISSN 1361-6463

Kusch, Gunnar and Li, Haoning and Edwards, Paul R. and Bruckbauer, Jochen and Sadler, Thomas C. and Parbrook, Peter J. and Martin, Robert W. (2014) Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN. Applied Physics Letters, 104 (9). 092114. ISSN 0003-6951

Naresh-Kumar, G. and Bruckbauer, J. and Edwards, P. R. and Kraeusel, S. and Hourahine, B. and Martin, R. W. and Kappers, M. J. and Moram, M. A. and Lovelock, S. and Oliver, R. A. and Humphreys, C. J. and Trager-Cowan, C. (2014) Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN. Microscopy and Microanalysis, 20 (1). pp. 55-60. ISSN 1431-9276

Bruckbauer, Jochen and Edwards, Paul R and Bai, Jie and Wang, Tao and Martin, Robert W (2013) Probing light emission from quantum wells within a single nanorod. Nanotechnology, 24 (36). 365704.

Zhuang, Yi D. and Lis, Szymon and Bruckbauer, Jochen and O'Kane, Simon E. J. and Shields, Philip A. and Edwards, Paul R. and Sarma, Jayanta and Martin, Robert W. and Allsopp, Duncan W. E. (2013) Optical properties of GaN nanorods containing a single or multiple InGaN quantum wells. Japanese Journal of Applied Physics, 52. 08JE11.

Naresh Kumar, G. and Mauder, C and Wang, K.R. and Kraeusel, Simon and Bruckbauer, Jochen and Edwards, P. R. and Hourahine, Benjamin and Kalisch, H. and Vescan, A. and Giesen, C. and Heuken, M and Trampert, A. and Day, A.P. and Trager-Cowan, Carol (2013) Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope. Applied Physics Letters, 102 (14). 142103. ISSN 0003-6951

Findlay, Neil J. and Orofino-Pena, Clara and Bruckbauer, Jochen and Elmasly, Saadeldin E. T. and Arumugam, Sasikumar and Inigo, Anto R. and Kanibolotsky, Alexander L. and Martin, Robert W. and Skabara, Peter J. (2013) Linear oligofluorene-BODIPY structures for fluorescence applications. Journal of Materials Chemistry. C, 1 (11). pp. 2249-2256. ISSN 2050-7526

Edwards, Paul R. and Krishnan Jagadamma, Lethy and Bruckbauer, Jochen and Liu, Chaowang and Shields, Philip and Allsopp, Duncan and Wang, Tao and Martin, Robert W. (2012) High-resolution cathodoluminescence hyperspectral imaging of nitride nanostructures. Microscopy and Microanalysis, 18 (6). pp. 1212-1219. ISSN 1431-9276

Trager-Cowan, Carol and Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Bruckbauer, Jochen and Martin, Robert and Mauder, Christof and Day, Austin and England, Gordon and Winkelmann, Aimo and Parbrook, Peter and Wilkinson, Anjus (2012) Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films. Microscopy and Microanalysis, 18 (S2). pp. 684-685. ISSN 1431-9276

Bruckbauer, Jochen and Edwards, Paul R. and Wang, Tao and Martin, Robert W. (2011) High resolution cathodoluminescence hyperspectral imaging of surface features in InGaN/GaN multiple quantum well structures. Applied Physics Letters, 98 (14). 141908.

Book Section

Bruckbauer, J. and Findlay, N. J.; Zhou, Ye, ed. (2021) Organic–inorganic semiconductor heterojunctions for hybrid light-emitting diodes. In: Optoelectronic Organic-Inorganic Semiconductor Heterojunctions. Taylor & Francis, CRC Press, Boca Raton, pp. 231-266. ISBN 978-0-367-34817-5

Massabuau, Fabien C.-P and Bruckbauer, Jochen and Trager-Cowan, Carol and Oliver, Rachel A; Tuomisto, Filip, ed. (2019) Microscopy of defects in semiconductors. In: Characaterisation and Control of Defects in Semiconductors. Materials, Circuits and Devices . IET, [S.I.]. ISBN 978-1-78561-655-6

This list was generated on Sun Dec 22 10:20:44 2024 GMT.