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World class computing and information science research at Strathclyde...

The Strathprints institutional repository is a digital archive of University of Strathclyde's Open Access research outputs. Strathprints provides access to thousands of Open Access research papers by University of Strathclyde researchers, including by researchers from the Department of Computer & Information Sciences involved in mathematically structured programming, similarity and metric search, computer security, software systems, combinatronics and digital health.

The Department also includes the iSchool Research Group, which performs leading research into socio-technical phenomena and topics such as information retrieval and information seeking behaviour.

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Number of items: 19.

Article

Naresh-Kumar, G. and Vilalta-Clemente, A. and Jussila, H. and Winkelmann, A. and Nolze, G. and Vespucci, S. and Nagarajan, S. and Wilkinson, A.J. and Trager-Cowan, C. (2017) Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction. Scientific Reports, 7. p. 10916. ISSN 2045-2322

Bruckbauer, Jochen and Li, Zhi and Gunasekar, Naresh and Warzecha, Monika and Edwards, Paul R. and Jiu, Ling and Bai, Jie and Wang, Tao and Trager-Cowan, Carol and Martin, Robert W. (2017) Spatially-resolved optical and structural properties of semi-polar (11-22) AlxGa1-xN with x up to 0.56. Scientific Reports, 7. ISSN 2045-2322

Le Boulbar, E. D. and Priesol, J. and Nouf-Allehiani, M. and Naresh-Kumar, G. and Fox, S. and Trager-Cowan, C. and Šatka, A. and Allsopp, D. W. E. and Shields, P. A. (2017) Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes. Journal of Crystal Growth. pp. 30-38. ISSN 0022-0248

Winkelmann, A. and Nolze, G. and Vespucci, S. and Gunasekar, N. and Trager-Cowan, C. and Vilalta-Clemente, A. and Wilkinson, A. J. and Vos, M. (2017) Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications. Journal of Microscopy. ISSN 0022-2720

Vespucci, S. and Naresh-Kumar, G. and Trager-Cowan, C. and Mingard, K. P. and Maneuski, D. and O'Shea, V. and Winkelmann, A. (2017) Diffractive triangulation of radiative point sources. Applied Physics Letters, 110 (12). ISSN 0003-6951

Vilalta-Clemente, A. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Gamarra, P. and di Forte-Poisson, M.A. and Trager-Cowan, C. and Wilkinson, A.J. (2017) Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films. Acta Materialia, 125. pp. 125-135. ISSN 1359-6454

Smith, M. D. and Thomson, D. and Zubialevich, V. Z. and Li, H. and Naresh-Kumar, G. and Trager-Cowan, C. and Parbrook, P. J. (2017) Nanoscale fissure formation in AlxGa1–xN/GaN heterostructures and their influence on Ohmic contact formation. Physica Status Solidi A, 214 (1). ISSN 1862-6300

Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R.W. and Trager-Cowan, C. (2016) Electron channelling contrast imaging for III-nitride thin film structures. Materials Science in Semiconductor Processing, 47. pp. 44-50. ISSN 1369-8001

Vespucci, S. and Winkelmann, A. and Naresh-Kumar, G. and Mingard, K. P. and Maneuski, D. and Edwards, P. R. and Day, A. P. and O'Shea, V. and Trager-Cowan, C. (2015) Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns. Physical Review B (Condensed Matter), 92 (20). ISSN 0163-1829

Kusch, Gunnar and Nouf-Allehiani, M. and Mehnke, Frank and Kuhn, Christian and Edwards, Paul R. and Wernicke, Tim and Knauer, Arne and Kueller, Viola and Naresh-Kumar, G. and Weyers, Markus and Kneissl, Michael and Trager-Cowan, Carol and Martin, Robert W. (2015) Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N. Applied Physics Letters, 107 (7). ISSN 0003-6951

Naresh-Kumar, G. and Vilalta-Clemente, A. and Pandey, S. and Skuridina, D. and Behmenburg, H. and Gamarra, P. and Patriarche, G. and Vickridge, I. and di Forte-Poisson, M. A. and Vogt, P. and Kneissl, M. and Morales, M. and Ruterana, P. and Cavallini, A. and Cavalcoli, D. and Giesen, C. and Heuken, M. and Trager-Cowan, C. (2014) Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors. AIP Advances, 4 (12). ISSN 2158-3226

Edwards, Paul R. and Wallace, Michael J. and Kusch, Gunnar and Naresh-Kumar, Gunasekar and Bruckbauer, Jochen and Trager-Cowan, Carol and O'Donnell, Kevin P. and Martin, Robert W. (2014) Cathodoluminescence hyperspectral imaging of nitride semiconductors : introducing new variables. Microscopy and Microanalysis, 20 (S3). pp. 906-907. ISSN 1435-8115

Trager-Cowan, C. and Naresh-Kumar, G. and Allehiani, N. and Kraeusel, S. and Hourahine, B. and Vespucci, S. and Thomson, D. and Bruckbauer, J. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mauder, C. and Day, A. P. and Winkelmann, A. and Vilalta-Clemente, A. and Wilkinson, A. J. and Parbrook, P. J. and Kappers, M. J. and Moram, M. A. and Oliver, R. A. and Humphreys, C. J. and Shields, P. and Le Boulbar, E. D. and Maneuski, D. and O'Shea, V. and Mingard, K. P. (2014) Electron channeling contrast imaging of defects in III-nitride semiconductors. Microscopy and Microanalysis, 20 (S3). pp. 1024-1025. ISSN 1435-8115

Naresh-Kumar, G. and Bruckbauer, J. and Edwards, P. R. and Kraeusel, S. and Hourahine, B. and Martin, R. W. and Kappers, M. J. and Moram, M. A. and Lovelock, S. and Oliver, R. A. and Humphreys, C. J. and Trager-Cowan, C. (2014) Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN. Microscopy and Microanalysis, 20 (1). pp. 55-60. ISSN 1431-9276

Naresh Kumar, G. and Mauder, C and Wang, K.R. and Kraeusel, Simon and Bruckbauer, Jochen and Edwards, P. R. and Hourahine, Benjamin and Kalisch, H. and Vescan, A. and Giesen, C. and Heuken, M and Trampert, A. and Day, A.P. and Trager-Cowan, Carol (2013) Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope. Applied Physics Letters, 102 (14). ISSN 0003-6951

Nagarajan, S. and Svensk, O. and Ali, M. and Naresh-Kumar, G. and Trager-Cowan, Carol and Suihkonen, S. and Sopanen, M. and Lipsanen, H. (2013) Stress distribution of GaN layer grown on micro-pillar patterned GaN templates. Applied Physics Letters, 103 (1). ISSN 0003-6951

Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Day, A.P. and Winkelmann, Aimo and Wilkinson, A.J. and Parbrook, P.J. and England, G. and Trager-Cowan, Carol (2012) Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. Physical Review Letters, 108 (13). ISSN 0031-9007

Naresh-Kumar, G. and Hourahine, Benjamin and Vilalta-Clemente, A. and Ruterana, P. and Gamarra, P. and Lacam, C. and Tordjman, M. and Forte-Poisson, M. A. di and Parbrook, P. J. and Day, A. P. and England, G. and Trager-Cowan, Carol (2012) Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope. Physica Status Solidi A, 209 (3). pp. 424-426. ISSN 1862-6300

Trager-Cowan, Carol and Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Bruckbauer, Jochen and Martin, Robert and Mauder, Christof and Day, Austin and England, Gordon and Winkelmann, Aimo and Parbrook, Peter and Wilkinson, Anjus (2012) Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films. Microscopy and Microanalysis, 18 (S2). pp. 684-685. ISSN 1431-9276

This list was generated on Wed Sep 20 08:44:51 2017 BST.