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Number of items: 6.
Naresh-Kumar, G. and Bruckbauer, J. and Edwards, P. R. and Kraeusel, S. and Hourahine, B. and Martin, R. W. and Kappers, M. J. and Moram, M. A. and Lovelock, S. and Oliver, R. A. and Humphreys, C. J. and Trager-Cowan, C. (2014) Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN. Microscopy and Microanalysis, 20 (1). pp. 55-60. ISSN 1431-9276
Naresh Kumar, G. and Mauder, C and Wang, K.R. and Kraeusel, Simon and Bruckbauer, Jochen and Edwards, P. R. and Hourahine, Benjamin and Kalisch, H. and Vescan, A. and Giesen, C. and Heuken, M and Trampert, A. and Day, A.P. and Trager-Cowan, Carol (2013) Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope. Applied Physics Letters, 102 (14). ISSN 0003-6951
Nagarajan, S. and Svensk, O. and Ali, M. and Naresh-Kumar, G. and Trager-Cowan, Carol and Suihkonen, S. and Sopanen, M. and Lipsanen, H. (2013) Stress distribution of GaN layer grown on micro-pillar patterned GaN templates. Applied Physics Letters, 103 (1). ISSN 0003-6951
Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Day, A.P. and Winkelmann, Aimo and Wilkinson, A.J. and Parbrook, P.J. and England, G. and Trager-Cowan, Carol (2012) Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. Physical Review Letters, 108 (13). ISSN 0031-9007
Naresh-Kumar, G. and Hourahine, Benjamin and Vilalta-Clemente, A. and Ruterana, P. and Gamarra, P. and Lacam, C. and Tordjman, M. and Forte-Poisson, M. A. di and Parbrook, P. J. and Day, A. P. and England, G. and Trager-Cowan, Carol (2012) Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope. Physica Status Solidi A, 209 (3). pp. 424-426. ISSN 1862-6300
Trager-Cowan, Carol and Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Bruckbauer, Jochen and Martin, Robert and Mauder, Christof and Day, Austin and England, Gordon and Winkelmann, Aimo and Parbrook, Peter and Wilkinson, Anjus (2012) Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films. Microscopy and Microanalysis, 18 (S2). pp. 684-685. ISSN 1431-9276
This list was generated on Thu Sep 18 12:20:56 2014 BST.