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Number of items: 3.
Naresh Kumar, G. and Mauder, C and Wang, K.R. and Kraeusel, Simon and Bruckbauer, Jochen and Edwards, P. R. and Hourahine, Benjamin and Kalisch, H. and Vescan, A. and Giesen, C. and Heuken, M and Trampert, A. and Day, A.P. and Trager-Cowan, Carol (2013) Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope. Applied Physics Letters, 102 (14). ISSN 0003-6951
Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Day, A.P. and Winkelmann, Aimo and Wilkinson, A.J. and Parbrook, P.J. and England, G. and Trager-Cowan, Carol (2012) Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. Physical Review Letters, 108 (13). ISSN 0031-9007
Naresh-Kumar, G. and Hourahine, Benjamin and Vilalta-Clemente, A. and Ruterana, P. and Gamarra, P. and Lacam, C. and Tordjman, M. and Forte-Poisson, M. A. di and Parbrook, P. J. and Day, A. P. and England, G. and Trager-Cowan, Carol (2012) Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope. Physica Status Solidi A, 209 (3). pp. 424-426. ISSN 1862-6300
This list was generated on Wed Jun 19 07:36:15 2013 BST.