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Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Jablon, B. M. and Johnston, R. and Martin, R. W. and McDermott, R. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Pascal, E. and Thomson, D. and Vespucci, S. and Mingard, K. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Knauer, A. and Hagedorn, S. and Walde, S. and Weyers, M. and Coulon, P-M and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Y. and Smith, R. M. and Wang, T. and Winkelmann, A. (2020) Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope. IOP Conference Series: Materials Science and Engineering, 891 (1). 012023. ISSN 1757-899X

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Johnston, R. and Naresh-Kumar, G. and Martin, R. W. and Nouf-Allehiani, M. and Pascal, E. and Spasevski, L. and Thomson, D. and Vespucci, S. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Hagedorn, S. and Knauer, A. and Kueller, V. and Walde, S. and Weyers, M. and Coulon, P.-M. and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Yipin and Smith, R. M. and Wang, T. and Winkelmann, A. (2019) Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research, 7 (11). B73-B82. ISSN 2327-9125

Mingard, K.P. and Stewart, M. and Gee, M.G. and Vespucci, S. and Trager-Cowan, C. (2018) Practical application of direct electron detectors to EBSD mapping in 2D and 3D. Ultramicroscopy, 184 (Part A). pp. 242-251. ISSN 0304-3991

Naresh-Kumar, G. and Vilalta-Clemente, A. and Jussila, H. and Winkelmann, A. and Nolze, G. and Vespucci, S. and Nagarajan, S. and Wilkinson, A.J. and Trager-Cowan, C. (2017) Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction. Scientific Reports, 7. 10916. ISSN 2045-2322

Winkelmann, A. and Nolze, G. and Vespucci, S. and Gunasekar, N. and Trager-Cowan, C. and Vilalta-Clemente, A. and Wilkinson, A. J. and Vos, M. (2017) Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications. Journal of Microscopy. ISSN 0022-2720

Vespucci, S. and Naresh-Kumar, G. and Trager-Cowan, C. and Mingard, K. P. and Maneuski, D. and O'Shea, V. and Winkelmann, A. (2017) Diffractive triangulation of radiative point sources. Applied Physics Letters, 110 (12). 124103. ISSN 0003-6951

Vespucci, S. and Winkelmann, A. and Mingard, K. and Maneuski, D. and O'Shea, V. and Trager-Cowan, C. (2017) Exploring transmission Kikuchi diffraction using a Timepix detector. Journal of Instrumentation, 12. C02075. ISSN 1748-0221

Vespucci, Stefano and Trager-Cowan, Carol and Maneuski, Dzmitry and O'Shea, Val and Winkelmann, Aimo (2016) Diffractive triangulation of radiative point sources. Preprint / Working Paper. arXiv.org, Ithaca, NY.

Vespucci, S. and Winkelmann, A. and Naresh-Kumar, G. and Mingard, K. P. and Maneuski, D. and Edwards, P. R. and Day, A. P. and O'Shea, V. and Trager-Cowan, C. (2015) Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns. Physical Review B (Condensed Matter), 92 (20). 205301. ISSN 0163-1829

Trager-Cowan, C. and Naresh-Kumar, G. and Allehiani, N. and Kraeusel, S. and Hourahine, B. and Vespucci, S. and Thomson, D. and Bruckbauer, J. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mauder, C. and Day, A. P. and Winkelmann, A. and Vilalta-Clemente, A. and Wilkinson, A. J. and Parbrook, P. J. and Kappers, M. J. and Moram, M. A. and Oliver, R. A. and Humphreys, C. J. and Shields, P. and Le Boulbar, E. D. and Maneuski, D. and O'Shea, V. and Mingard, K. P. (2014) Electron channeling contrast imaging of defects in III-nitride semiconductors. Microscopy and Microanalysis, 20 (S3). pp. 1024-1025. ISSN 1435-8115