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Hiller, Kieran P and Winkelmann, Aimo and Hourahine, Ben and Starosta, Bohdan and Alasmari, Aeshah and Feng, Peng and Wang, Tao and Parbrook, Peter J and Zubialevich, Vitaly Z and Hagedorn, Sylvia and Walde, Sebastian and Weyers, Markus and Coulon, Pierre-Marie and Shields, Philip A and Bruckbauer, Jochen and Trager-Cowan, Carol (2023) Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction. Microscopy and Microanalysis, 29 (6). pp. 1879-1888. ISSN 1431-9276

Winkelmann, Aimo and Nolze, Gert and Cios, Grzegorz and Tokarski, Tomasz and Bała, Piotr and Hourahine, Ben and Trager‐Cowan, Carol (2021) Kikuchi pattern simulations of backscattered and transmitted electrons. Journal of Microscopy, 284 (2). pp. 157-184. ISSN 0022-2720

Nolze, Gert and Tokarski, Tomasz and Rychłowski, Łukasz and Cios, Grzegorz and Winkelmann, Aimo (2021) Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns. Journal of Applied Crystallography, 54 (3). pp. 1012-1022. ISSN 0021-8898

Nolze, Gert and Winkelmann, Aimo and Cios, Grzegorz and Tokarski, Tomasz (2021) Tetragonality mapping of martensite in a high-carbon steel by EBSD. Materials Characterization, 175. 111040. ISSN 1044-5803

Cios, Grzegorz and Nolze, Gert and Winkelmann, Aimo and Tokarski, Tomasz and Hielscher, Ralf and Strzałka, Radoslaw and Bugański, Ireneusz and Wolny, Janusz and Bała, Piotr (2020) Approximant-based orientation determination of quasicrystals using electron backscatter diffraction. Ultramicroscopy, 218. 113093. ISSN 0304-3991

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Jablon, B. M. and Johnston, R. and Martin, R. W. and McDermott, R. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Pascal, E. and Thomson, D. and Vespucci, S. and Mingard, K. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Knauer, A. and Hagedorn, S. and Walde, S. and Weyers, M. and Coulon, P-M and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Y. and Smith, R. M. and Wang, T. and Winkelmann, A. (2020) Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope. IOP Conference Series: Materials Science and Engineering, 891 (1). 012023. ISSN 1757-899X

Winkelmann, Aimo and Nolze, Gert and Cios, Grzegorz and Tokarski, Tomasz and Bała, Piotr (2020) Refined calibration model for improving the orientation precision of electron backscatter diffraction maps. Materials, 13 (12). 2816. ISSN 1996-1944

Winkelmann, Aimo and Cios, Grzegorz and Tokarski, Tomasz and Nolze, Gert and Hielscher, Ralf and Kozieł, Tomasz (2020) EBSD orientation analysis based on experimental Kikuchi reference patterns. Acta Materialia, 188. pp. 376-385. ISSN 1359-6454

Trager-Cowan, Carol and Alasmari, Aeshah and Avis, William and Bruckbauer, Jochen and Edwards, Paul R and Ferenczi, Gergely and Hourahine, Benjamin and Kotzai, Almpes and Kraeusel, Simon and Kusch, Gunnar and Martin, Robert W and McDermott, Ryan and Gunasekar, Naresh and Nouf-Allehiani, M. and Pascal, Elena and Thomson, David and Vespucci, Stefano and Smith, Matthew David and Parbrook, Peter J and Enslin, Johannes and Mehnke, Frank and Kuhn, Christian and Wernicke, Tim and Kneissl, Michael and Hagedorn, Sylvia and Knauer, Arne and Walde, Sebastian and Weyers, Markus and Coulon, Pierre-Marie and Shields, Philip and Bai, J. and Gong, Y. and Jiu, Ling and Zhang, Y. and Smith, Richard and Wang, Tao and Winkelmann, Aimo (2020) Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope. Semiconductor Science and Technology, 35 (5). 054001. ISSN 0268-1242

Jablon, B.M. and Mingard, K. and Winkelmann, A. and Naresh-Kumar, G. and Hourahine, B. and Trager-Cowan, C. (2020) Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging. International Journal of Refractory Metals and Hard Materials, 87. 105159. ISSN 0263-4368

Winkelmann, A. and Jablon, B.M. and Tong, V.S. and Trager-Cowan, C. and Mingard, K.P. (2020) Improving EBSD precision by orientation refinement with full pattern matching. Journal of Microscopy, 277 (2). pp. 79-92. ISSN 0022-2720

Bruckbauer, Jochen and Trager-Cowan, Carol and Hourahine, Ben and Winkelmann, Aimo and Vennéguès, Philippe and Ipsen, Anja and Yu, Xiang and Zhao, Xunming and Wallace, Michael J. and Edwards, Paul R. and Naresh-Kumar, G. and Hocker, Matthias and Bauer, Sebastian and Müller, Raphael and Bai, Jie and Thonke, Klaus and Wang, Tao and Martin, Robert W. (2020) Luminescence behavior of semipolar (10-11) InGaN/GaN "bow-tie" structures on patterned Si substrates. Journal of Applied Physics, 127 (3). 035705. ISSN 0021-8979

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Johnston, R. and Naresh-Kumar, G. and Martin, R. W. and Nouf-Allehiani, M. and Pascal, E. and Spasevski, L. and Thomson, D. and Vespucci, S. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Hagedorn, S. and Knauer, A. and Kueller, V. and Walde, S. and Weyers, M. and Coulon, P.-M. and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Yipin and Smith, R. M. and Wang, T. and Winkelmann, A. (2019) Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research, 7 (11). B73-B82. ISSN 2327-9125

Naresh-Kumar, G. and Bruckbauer, J. and Winkelmann, A. and Yu, X. and Hourahine, B. and Edwards, P. R. and Wang, T. and Trager-Cowan, C. and Martin, R. W. (2019) Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope. Nano Letters, 19 (6). pp. 3863-3870. ISSN 1530-6992