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O'Hanlon, T.J. and Zhu, T. and Massabuau, F.C.-P. and Oliver, R.A. (2021) Dislocations at coalescence boundaries in heteroepitaxial GaN/sapphire studied after the epitaxial layer has completely coalesced. Ultramicroscopy, 231. 113258. ISSN 0304-3991
O'Hanlon, T.J. and Massabuau, F C-P. and Bao, A. and Kappers, M.J. and Oliver, R.A. (2021) Directly correlated microscopy of trench defects in InGaN quantum wells. Ultramicroscopy, 231. 113255. ISSN 0304-3991
Cios, Grzegorz and Nolze, Gert and Winkelmann, Aimo and Tokarski, Tomasz and Hielscher, Ralf and Strzałka, Radoslaw and Bugański, Ireneusz and Wolny, Janusz and Bała, Piotr (2020) Approximant-based orientation determination of quasicrystals using electron backscatter diffraction. Ultramicroscopy, 218. 113093. ISSN 0304-3991
Naresh-Kumar, G. and Alasamari, A. and Kusch, G. and Edwards, P. R. and Martin, R. W. and Mingard, K. P. and Trager-Cowan, C. (2020) Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope. Ultramicroscopy, 213. 112977. ISSN 0304-3991
O'Hanlon, T.J. and Bao, A. and Massabuau, F.C.-P. and Kappers, M.J. and Oliver, R.A. (2020) Cross-shaped markers for the preparation of site-specific transmission electron microscopy lamellae using focused ion beam techniques. Ultramicroscopy, 212. 112970. ISSN 0304-3991
Pascal, Elena and Singh, Saransh and Callahan, Patrick G. and Hourahine, Ben and Trager-Cowan, Carol and De Graef, Marc (2018) Energy-weighted dynamical scattering simulations of electron diffraction modalites in the scanning electron microscope. Ultramicroscopy, 187. pp. 98-106. ISSN 0304-3991
Mingard, K.P. and Stewart, M. and Gee, M.G. and Vespucci, S. and Trager-Cowan, C. (2018) Practical application of direct electron detectors to EBSD mapping in 2D and 3D. Ultramicroscopy, 184 (Part A). pp. 242-251. ISSN 0304-3991
Moldovan, Grigore and Kazemian, Payani and Edwards, Paul R. and Ong, Vincent K. S. and Kurniawan, Oka and Humphreys, Colin J. (2007) Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices. Ultramicroscopy, 107 (4-5). pp. 382-389. ISSN 0304-3991
Winkelmann, Aimo and Trager-Cowan, Carol and Sweeney, Francis and Day, Austin P. and Parbrook, Peter (2007) Many-Beam Dynamical Simulation of Electron Backscatter Diffraction Patterns. Ultramicroscopy, 107 (2007). pp. 414-421. ISSN 0304-3991