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Open Access research that delivers better decision support and knowledge modelling

Strathprints makes available Open Access scholarly outputs by Management Science at Strathclyde. Particular research specialisms include knowledge modelling within organisations but also problem structuring and analytical approaches to better interpret risk and uncertainty. Some of these management science approaches are applied within healthcare systems and have close links with economics and operations management.

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Number of items: 2.

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Jablon, B. M. and Johnston, R. and Martin, R. W. and McDermott, R. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Pascal, E. and Thomson, D. and Vespucci, S. and Mingard, K. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Knauer, A. and Hagedorn, S. and Walde, S. and Weyers, M. and Coulon, P-M and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Y. and Smith, R. M. and Wang, T. and Winkelmann, A. (2020) Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope. IOP Conference Series: Materials Science and Engineering, 891 (1). 012023. ISSN 1757-899X

Trager-Cowan, C. and Alasmari, A. and Avis, W. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kraeusel, S. and Kusch, G. and Johnston, R. and Naresh-Kumar, G. and Martin, R. W. and Nouf-Allehiani, M. and Pascal, E. and Spasevski, L. and Thomson, D. and Vespucci, S. and Parbrook, P. J. and Smith, M. D. and Enslin, J. and Mehnke, F. and Kneissl, M. and Kuhn, C. and Wernicke, T. and Hagedorn, S. and Knauer, A. and Kueller, V. and Walde, S. and Weyers, M. and Coulon, P.-M. and Shields, P. A. and Zhang, Y. and Jiu, L. and Gong, Yipin and Smith, R. M. and Wang, T. and Winkelmann, A. (2019) Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research, 7 (11). B73-B82. ISSN 2327-9125

This list was generated on Thu Aug 18 08:02:21 2022 BST.