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Transforming automated inspection & non-destructive testing: world-leading Open Access research on robotics, sensors & ultrasonics

Strathprints makes available scholarly Open Access content by researchers within the Centre for Ultrasonic Engineering, based within Electronic & Electrical Engineering.

Research at CUE brings together next generation robotics with sensing technology to enable inspection of high value components, such as aerospace components, at the point of manufacture. Non-destructive testing techniques using ultrasound and other sensors can then be deployed to assess components for structural faults or damage and thereby ensure they are built correctly and more efficiently. Research at CUE is to be stimulated by the construction of a new £2.5 million state-of-the-art Robotically-Enabled Sensing (RES) hub within the Department of Electronic & Electrical Engineering (EEE).

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Group by: Publication Date | Item type | No Grouping
Jump to: 2018 | 2017
Number of items: 4.

2018

Edwards, Paul R. and O'Donnell, Kevin P. and Singh, Akhilesh K. and Cameron, Douglas and Lorenz, Katharina and Yamaga, Mitsuo and Leach, Jacob H. and Kappers, Menno J. and Boćkowski, Michal (2018) Hysteretic photochromic switching (HPS) in doubly doped GaN(Mg):Eu—a summary of recent results. Materials, 11 (10). 1800. ISSN 1996-1944

Singh, A K and O'Donnell, K P and Edwards, P R and Lorenz, K and Leach, J H and Boćkowski, M (2018) Eu-Mg defects and donor-acceptor pairs in GaN : photodissociation and the excitation transfer problem. Journal of Physics D: Applied Physics, 51 (6). 065106. ISSN 0022-3727

2017

Singh, A. K. and O'Donnell, K. P. and Edwards, P. R. and Cameron, D. and Lorenz, K. and Kappers, M. J. and Boćkowski, M. and Yamaga, M. and Prakash, R. (2017) Luminescence of Eu3+ in GaN(Mg, Eu): transitions from the 5D1 level. Applied Physics Letters, 111 (24). 241105. ISSN 0003-6951

Singh, A. K. and O'Donnell, K. P. and Edwards, P. R. and Lorenz, K. and Kappers, M. J. and Bokowski, M. (2017) Hysteretic photochromic switching of Eu-Mg defects in GaN links the shallow transient and deep ground states of the Mg acceptor. Scientific Reports, 7. 41982. ISSN 2045-2322

This list was generated on Sun Apr 5 18:31:42 2020 BST.