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Up a level2018
Yakushev, Michael V. and Sulimov, Mikhail A. and Skidchenko, Ekaterina and Márquez-Prieto, Jose and Forbes, Ian and Edwards, Paul R. and Kuznetsov, Mikhail V. and Zhivulko, Vadim D. and Borodavchenko, Olga M. and Mudryi, Alexander V. and Krustok, Juri and Martin, Robert W. (2018) Effects of Ar+ etching of Cu2ZnSnSe4 thin films : an x-ray photoelectron spectroscopy and photoluminescence study. Journal of Vacuum Science and Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 36. 061208. ISSN 2166-2754
2016
Liu, Hangyu and Herrnsdorf, Johannes and Gu, Erdan and Dawson, Martin D. (2016) Control of edge bulge evolution during photoresist reflow and it's application to diamond micro-lens fabrication. Journal of Vacuum Science and Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 34 (2). 021602. ISSN 2166-2754
Cheng, Tin S. and Davies, Andrew and Summerfield, Alex and Cho, YongJin and Cebula, Izabela and Hill, Richard J. A. and Mellor, Christopher J. and Khlobystov, Andrei N. and Taniguchi, Takashi and Watanabe, Kenji and Beton, Peter H. and Foxon, C. Thomas and Eaves, Laurence and Novikov, Sergei V. (2016) High temperature MBE of graphene on sapphire and hexagonal boron nitride flakes on sapphire. Journal of Vacuum Science and Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 34 (2). 02L101. ISSN 2166-2754