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2020
Xie, Wujun and Chen, Haochang and Li, David Day-Uei (2020) Are wave union methods still suitable for 20 nm FPGA-based high-resolution (< 2 ps) time-to-digital converters? Working paper. arXiv.org, Ithaca, New York.
2019
Griffiths, Alexander D. and Chen, Haochang and Li, David Day-Uei and Henderson, Robert K. and Herrnsdorf, Johannes and Dawson, Martin D. and Strain, Michael J. (2019) Multispectral time-of-flight imaging using light-emitting diodes. Optics Express, 27 (24). pp. 35485-35498. ISSN 1094-4087
Henderson, Robert K. and Johnston, Nick and Mattioli Della Rocca, Francesco and Chen, Haochang and Li, David Day-Uei and Hungerford, Graham and Hirsch, Richard and McLoskey, David and Yip, Philip and Birch, David J.S. (2019) A 192 X 128 time correlated SPAD image sensor in 40nm CMOS technology. IEEE Journal of Solid-State Circuits, 54 (7). pp. 1907-1916. ISSN 0018-9200
Griffiths, Alexander D. and Chen, Haochang and Herrnsdorf, Johannes and Li, David and Henderson, Robert K. and Strain, Michael J. and Dawson, Martin D.; (2019) Hyperspectral imaging under low illumination with a single photon camera. In: 2018 British and Irish Conference on Optics and Photonics, BICOP 2018 - Proceedings. IEEE, GBR. ISBN 9781538673614
2018
Chen, Haochang and Li, David Day-Uei (2018) Multi-channel, low nonlinearity time-to-digital converters based on 20nm and 28nm FPGAs. IEEE Transactions on Industrial Electronics. ISSN 0278-0046
Henderson, Robert K. and Johnston, Nick and Chen, Haochang and Li, David Day-Uei and Hungerford, Graham and Hirsch, Richard and Yip, Philip and McLoskey, David and Birch, David; (2018) A 192 x 128 time correlated single photon counting imager in 40nm CMOS technology. In: 44th European Solid-State Circuits Conference (ESSCIRC) 2018. IEEE, DEU.
2017
Chen, Haochang and Zhang, Yongliang and Li, David Day-Uei (2017) A low nonlinearity, missing-code free time-to-digital converter based on 28nm FPGAs with embedded bin-width calibrations. IEEE Transactions on Instrumentation and Measurement, 66 (7). 1912 - 1921. ISSN 0018-9456