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Massabuau, Fabien C.-P and Bruckbauer, Jochen and Trager-Cowan, Carol and Oliver, Rachel A; Tuomisto, Filip, ed. (2019) Microscopy of defects in semiconductors. In: Characaterisation and Control of Defects in Semiconductors. Materials, Circuits and Devices . IET, [S.I.]. ISBN 978-1-78561-655-6