In-situ reflectometry based studies of lateral epitaxial overgrowth

Watson, I.M. and Kim, K.S. and Kim, H.S. and Liu, C. and Deatcher, C.J. and Girkin, J.M. and Dawson, M.D. and Edwards, P.R. and Trager-Cowan, C. and Martin, R.W. (2001) In-situ reflectometry based studies of lateral epitaxial overgrowth. In: UK Nitrides Consortium Meeting, 2001-09-01. (Unpublished)

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Abstract

This paper covers in-situ reflectometry based studies of lateral epitaxial overgrowth. It was presented at the 2001 UK Nitrides consortium.

ORCID iDs

Watson, I.M. ORCID logoORCID: https://orcid.org/0000-0002-8797-3993, Kim, K.S., Kim, H.S., Liu, C., Deatcher, C.J., Girkin, J.M., Dawson, M.D. ORCID logoORCID: https://orcid.org/0000-0002-6639-2989, Edwards, P.R. ORCID logoORCID: https://orcid.org/0000-0001-7671-7698, Trager-Cowan, C. ORCID logoORCID: https://orcid.org/0000-0001-8684-7410 and Martin, R.W. ORCID logoORCID: https://orcid.org/0000-0002-6119-764X;
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