In-situ reflectometry based studies of lateral epitaxial overgrowth

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Watson, I.M. and Kim, K.S. and Kim, H.S. and Liu, C. and Deatcher, C.J. and Girkin, J.M. and Dawson, M.D. and Edwards, P.R. and Trager-Cowan, C. and Martin, R.W. (2001) In-situ reflectometry based studies of lateral epitaxial overgrowth. In: UK Nitrides Consortium Meeting, 2001-09-01. (Unpublished)

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Abstract

This paper covers in-situ reflectometry based studies of lateral epitaxial overgrowth. It was presented at the 2001 UK Nitrides consortium.

ORCID iDs

Watson, I.M. ORCID logoORCID: https://orcid.org/0000-0002-8797-3993, Kim, K.S., Kim, H.S., Liu, C., Deatcher, C.J., Girkin, J.M., Dawson, M.D. ORCID logoORCID: https://orcid.org/0000-0002-6639-2989, Edwards, P.R. ORCID logoORCID: https://orcid.org/0000-0001-7671-7698, Trager-Cowan, C. ORCID logoORCID: https://orcid.org/0000-0001-8684-7410 and Martin, R.W. ORCID logoORCID: https://orcid.org/0000-0002-6119-764X;
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