Acceptance reliability sampling plan for items with two failure modes

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Cha, Ji Hwan and Finkelstein, Maxim (2022) Acceptance reliability sampling plan for items with two failure modes. Statistics : A Journal of Theoretical and Applied Statistics, 56 (6). pp. 1345-1363. ISSN 1029-4910 (https://doi.org/10.1080/02331888.2022.2154354)

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Abstract

Existing reliability sampling plans reported in the literature assume that the items have only one failure mode. However, in practice, the items can fail due to two or more failure modes. In this paper, we study acceptance reliability sampling plan for items, which can fail due to the normal ageing and an external fatal shock during field operation. Two-stage reliability sampling plan that takes into account these two factors is developed. The lifetimes of items in a population before and after the acceptance test are stochastically compared.

ORCID iDs

Cha, Ji Hwan and Finkelstein, Maxim ORCID logoORCID: https://orcid.org/0000-0002-3018-8353;
CORE (COnnecting REpositories)