RBS-channeling study of radiation damage in Ar+ implanted CuInSe2 crystals

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Yakushev, Michael V. and Volkov, Vladimir A. and Mursakulov, Niyazi N. and Sabzaliyeva, Chimnaz E. and Martin, Robert W. (2016) RBS-channeling study of radiation damage in Ar+ implanted CuInSe2 crystals. Journal of Vacuum Science and Technology A, 34 (5). 051203. ISSN 0734-2101 (https://doi.org/10.1116/1.4961882)

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Abstract

Chalcopyrite solar cells are reported to have a high tolerance to irradiation by high energy electrons or ions, but the origin of this is not well understood. This work studies the evolution of damage in Ar + -bombarded CuInSe 2 single crystal using Rutherford backscattering/channeling analysis. Ar + ions of 30 keV were implanted with doses in the range from 10 12 to 3 × 10 16 cm -2 at room temperature. Implantation was found to create two layers of damage: (1) on the surface, caused by preferential sputtering of Se and Cu atoms; (2) at the layer of implanted Ar, possibly consisting of stacking faults and dislocation loops. The damage in the second layer was estimated to be less than 2% of the theoretical prediction suggesting efficient healing of primary implantation defects.

ORCID iDs

Yakushev, Michael V., Volkov, Vladimir A., Mursakulov, Niyazi N., Sabzaliyeva, Chimnaz E. and Martin, Robert W. ORCID logoORCID: https://orcid.org/0000-0002-6119-764X;
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