Corrigendum : Cathodoluminescence nano-characterization of semiconductors (2011 Semicond. Sci. Technol. 26 064005)

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Edwards, Paul R and Martin, Robert W (2018) Corrigendum : Cathodoluminescence nano-characterization of semiconductors (2011 Semicond. Sci. Technol. 26 064005). Semiconductor Science and Technology, 33. 079501. ISSN 0268-1242 (https://doi.org/10.1088/1361-6641/aac678)

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Abstract

In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.

ORCID iDs

Edwards, Paul R ORCID logoORCID: https://orcid.org/0000-0001-7671-7698 and Martin, Robert W ORCID logoORCID: https://orcid.org/0000-0002-6119-764X;
CORE (COnnecting REpositories)