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Transforming automated inspection & non-destructive testing: world-leading Open Access research on robotics, sensors & ultrasonics

Strathprints makes available scholarly Open Access content by researchers within the Centre for Ultrasonic Engineering, based within Electronic & Electrical Engineering.

Research at CUE brings together next generation robotics with sensing technology to enable inspection of high value components, such as aerospace components, at the point of manufacture. Non-destructive testing techniques using ultrasound and other sensors can then be deployed to assess components for structural faults or damage and thereby ensure they are built correctly and more efficiently. Research at CUE is to be stimulated by the construction of a new £2.5 million state-of-the-art Robotically-Enabled Sensing (RES) hub within the Department of Electronic & Electrical Engineering (EEE).

Explore the Open Access research by EEE, or explore all of Strathclyde's Open Access research...

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Jump to: 2010 | 2009 | 2003 | 2000
Number of items: 4.

2010

Khokhar, A.Z and Parsons, K. and Hubbard, G. and Rahman, F. and MacIntyre, D.S. and Xiong, C. and Massoubre, D. and Gong, Z. and Johnson, N.P. and De La Rue, R.M. and Watson, I.M. and Gu, E. and Dawson, M.D. and Abbott, S.J. and Charlton, M.D.B and Tillin, M. (2010) Nanofabrication of gallium nitride photonic crystal light-emitting diodes. Microelectronic Engineering, 87 (11). pp. 2200-2207. ISSN 0167-9317

2009

Cleary, A. and Clarke, A. and Glidle, A. and Cooper, J.M. and Cumming, D. (2009) Fabrication of double split metallic nanorings for raman sensing. Microelectronic Engineering, 86 (4-6). pp. 1146-1149. ISSN 0167-9317

2003

Mathieson, K and Cunningham, W and Marchal, J and Melone, J and Horn, M and O'Shea, V and Smith, KM and Litke, A and Chichilnisky, EJ and Rahman, M (2003) Fabricating high-density microarrays for retinal recording. Microelectronic Engineering, 67-8. pp. 520-527. ISSN 0167-9317

2000

Rahman, M and Williamson, JG and Mathieson, K and Dick, G and Brown, MJ and Duffy, S and Wilkinson, CDW (2000) Quantum electron beam probe of sidewall dry-etch damage. Microelectronic Engineering, 53 (1-4). pp. 371-374. ISSN 0167-9317

This list was generated on Sun Apr 5 19:01:08 2020 BST.