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Number of items: 2.
2000
Wark, A.W. and Berlouis, L.E.A. and Cruickshank, F.R. and Pugh, David and Brevet, P.F. (2000) In-situ evaluation of the anodic oxide growth on CdxHg1-xTe (MCT) using ellipsometry and second harmonic generation. Journal of Electronic Materials, 29 (6). pp. 648-653. ISSN 0361-5235
1999
Berlouis, L.E.A. and Wark, A.W. and Cruickshank, F.R. and Pugh, David and Brevet, Pierre-Francois (1999) Surface second harmonic generation in the characterization of anodic sulphide and oxide films on Hg1-xCdxTe (MCT). Journal of Electronic Materials, 28 (6). pp. 830-837. ISSN 0361-5235