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Henderson, Robert K. and Johnston, Nick and Mattioli Della Rocca, Francesco and Chen, Haochang and Li, David Day-Uei and Hungerford, Graham and Hirsch, Richard and McLoskey, David and Yip, Philip and Birch, David J.S. (2019) A 192 X 128 time correlated SPAD image sensor in 40nm CMOS technology. IEEE Journal of Solid-State Circuits, 54 (7). pp. 1907-1916. ISSN 0018-9200