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K

Kotsampopoulos, P. and Jensen, T. V. and Babazadeh, D. and Strasser, T. I. and Rikos, E. and Nguyen, V. H. and Tran, Q. T. and Bhandia, R. and Guillo Sansano, E. and Heussen, K. and Narayan, A. and Nguyen, T. L. and Burt, G. M. and Hatziargyriou, N.; Strasser, Thomas I. and de Jong, Erik C. W. and Sosnina, Maria, eds. (2020) Education and training needs, methods, and tools. In: European Guide to Power System Testing. Springer, Cham, Switzerland, pp. 113-128. ISBN 978-3-030-42274-5

N

Nguyen, V. H. and Tran, Q. T. and Guillo Sansano, E. and Kotsampopoulos, P. and Gavriluta, C. and Lauss, G. and Strasser, T. I. and Jensen, T. V. and Heussen, K. and Gehrke, O. and Besanger, Y. and Nguyen, T. L. and Syed, M. H. and Brandl, R. and Arnold, G.; Strasser, Thomas I. and de Jong, Erik C. W. and Sosnina, Maria, eds. (2020) Hardware-in-the-loop assessment methods. In: European Guide to Power System Testing. Springer, Cham, Switzerland, pp. 51-66. ISBN 978-3-030-42274-5

P

Pellegrino, L. and Pala, D. and Bionda, E. and Rajkumar, V. S. and Bhandia, R. and Syed, M. H. and Guillo-Sansano, E. and Jimeno, J. and Merino, J. and Lagos, D. and Maniatopoulos, M. and Kotsampopoulos, P. and Akroud, N. and Gehrke, O. and Heussen, K. and Tran, Q.T. and Nguyen, V. H.; Strasser, Thomas I. and de Jong, Erik C. W. and Sosnina, Maria, eds. (2020) Laboratory coupling approach. In: European Guide to Power System Testing. Springer, Cham, Switzerland, pp. 67-86. ISBN 978-3-030-42274-5