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Article
Jordan, Kirsty C and Menolotto, Matteo and Bolster, Nigel M and Livingstone, Iain AT and Giardini, Mario E (2017) A review of feature-based retinal image analysis. Expert Review of Ophthalmology, 12 (3). pp. 207-220. ISSN 1746-9899
Bolster, Nigel M. and Giardini, Mario E. and Bastawrous, Andrew (2016) The diabetic retinopathy screening workflow : potential for smartphone imaging. Journal of Diabetes Science and Technology, 10 (2). ISSN 1932-2968
Bastawrous, Andrew and Giardini, Mario Ettore and Bolster, Nigel M. and Peto, Tunde and Shah, Nisha and Livingstone, Iain A.T. and Weiss, Helen A. and Hu, Sen and Rono, Hillary and Kuper, Hannah and Burton, Matthew (2016) Clinical validation of a smartphone-based adapter for optic disc imaging in Kenya. JAMA Ophthalmology, 134 (2). pp. 151-158. ISSN 2168-6173
Bolster, Nigel M and Giardini, Mario E and Livingstone, Iain AT and Bastawrous, Andrew (2014) How the smartphone is driving the eye-health imaging revolution. Expert Review of Ophthalmology, 9 (6). pp. 475-485. ISSN 1746-9899
Book Section
Bolster, Nigel M. and Bastawrous, Andrew and Giardini, Mario E.; (2015) Towards a workflow driven design for mHealth devices within temporary eye clinics in low-income settings. In: 2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC). IEEE, ITA, pp. 7312-7315. ISBN 9781424492718
Giardini, Mario E. and Livingstone, Iain A. T. and Jordan, Stewart and Bolster, Nigel M. and Peto, Tunde and Burton, Matthew and Bastawrous, Andrew; (2014) A smartphone based ophthalmoscope. In: 2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC). IEEE, USA, pp. 2177-2180. ISBN 9781424479276
Conference or Workshop Item
Giardini, Mario E. and Livingstone, Iain A.T. and Bolster, Nigel M. and Jordan, Stewart and Bastawrous, Andrew (2014) Phone-based ophthalmoscopy for Peek, the Portable Eye Examination Kit. In: Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE, 2014-08-26 - 2014-08-30, IL.