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2017
Cross, A. W. and Yin, H. and Zhang, L. and He, W. and Shu, G. and Zhao, J. and Yin, Y. and Ronald, K. and Phelps, A. D. R.; (2017) Study of millimetre wave extended interaction oscillation using pseudospark-sourced E-beams. In: 2017 47th European Microwave Conference. IEEE, DEU, pp. 560-563. ISBN 9782874870477
Yin, H. and Zhang, L. and He, W. and Shu, G. and Zhao, J. and Yin, Y. and Ronald, K. and Phelps, A.D.R. and Cross, A.W.; (2017) Investigation of millimeter wave extended interaction oscillation using improved pseudospark-sourced electron beams. In: 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, MEX. ISBN 9781509060481
Yin, H. and Zhang, L. and Yin, Y. and Zhao, J. and Shu, G. and He, W. and Cross, A. W. and Phelps, A. D. R. (2017) Pseudospark excited sub-THz frequency sources. EPJ Web of Conferences, 149. 05015. ISSN 2101-6275
Zhao, J. and Yin, H. and Zhang, L. and Shu, G. and He, W. and Phelps, A. D. R. and Cross, A. W. and Pang, L. and Zhang, Q. (2017) Study of the beam profile and position instability of a post-accelerated pseudospark-sourced electron beam. Physics of Plasmas, 24 (3). 033118. ISSN 1070-664X (In Press)
Zhao, J. and Yin, H. and Zhang, L. and Shu, G. and He, W. and Zhang, Q. and Phelps, A. D. R. and Cross, A. W. (2017) Advanced post-acceleration methodology for pseudospark-sourced electron beam. Physics of Plasmas, 24 (2). 023105. ISSN 1070-664X
2016
Shu, Guoxiang and He, Wenlong and Zhang, Liang and Yin, Huabi and Zhao, Junping and Cross, Adrian W. and Phelps, Alan D. R. (2016) Study of a 0.2 THz extended interaction oscillator driven by a pseudospark-sourced sheet electron beam. IEEE Transactions on Electron Devices, 63 (12). pp. 4955-4960. ISSN 0018-9383
Shu, Guoxiang and He, Wenlong and Zhang, Liang and Yin, Huabi and Cross, A.W. and Phelps, A.D.R.; (2016) Preliminary design of a G-band extended interaction oscillator driven by a sheet electron beam. In: IET Colloquium on Millimetre-Wave and Terahertz Engineering & Technology 2016. IET, GBR. ISBN 9781785612220