DC fault protection algorithms of MMC HVDC grids : fault analysis, methodologies, experimental validations and future trends

Xiang, Wang and Yang, Saizhao and Adam, Grain Philip and Zhang, Haobo and Zuo, Wenping and Wen, Jinyu (2021) DC fault protection algorithms of MMC HVDC grids : fault analysis, methodologies, experimental validations and future trends. IEEE Transactions on Power Electronics, 36 (10). pp. 11245-11264. ISSN 0885-8993 (https://doi.org/10.1109/TPEL.2021.3071184)

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Abstract

To protect the converters and minimize the power transmission interruption during dc line faults, it is necessary to detect the faults at ultra high speed for the modular multilevel converter (MMC)-based HVdc grids. This article reviews the state-of-the-art of dc fault protection methods of MMC-HVdc grids, and summarizes the underlying principles of each method. On this basis, the dc fault characteristics analysis in terms of modal-domain, time-domain, and frequency-domain are analyzed, which direct the protection design. Typical boundary protection and nonboundary protection schemes are reviewed. The advantages and disadvantages of existing fault protection methods are compared. A two-terminal MMC-HVdc prototype is developed to test the effectiveness of three fault protection methods. Comprehensive quantitative assessments of the protection methods discussed above are carried out in a four-terminal MMC-HVdc grid. Finally, the future trends of the protection schemes are discussed and the findings are concluded.

  • Item type:Article
    ID code:76043
    Dates:
    Date
    Event
    October 2021
    Published
    2 April 2021
    Accepted
    Notes:© 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Depositing user: Pure Administrator
    Date deposited:08 Apr 2021 10:27
    Last modified:25 Apr 2024 01:21
    URI:https://strathprints.strath.ac.uk/id/eprint/76043
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