Intelligent fault location in MTDC networks by recognising patterns in hybrid circuit breaker currents during fault clearance process

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Tzelepis, Dimitrios and Mirsaeidi, Sohrab and Dyśko, Adam and Hong, Qiteng and He, Jinghan and Booth, Campbell (2020) Intelligent fault location in MTDC networks by recognising patterns in hybrid circuit breaker currents during fault clearance process. IEEE Transactions on Industrial Informatics. ISSN 1551-3203 (https://doi.org/10.1109/TII.2020.3003476)

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Abstract

In this paper, a novel, learning-based method for accurate location of faults in MTDC networks is proposed. By assessing the DC circuit breaker currents during the fault clearance process, a pattern recognition approach is adopted from which the fault location is estimated. The implementation of the algorithm is allocated into three main stages, where similarity coefficients and weighted averaging functions (incorporating exponential kernels) are utilized. For the proposed algorithm, only a short-time window of data (equal to 6 ms) is required. The performance of the proposed method is assessed through detailed transient simulation using verified MATLAB/Simulink models. Training patterns have been retrieved by applying a series of different faults within an MTDC network. Simulation and experimental results revealed that the proposed scheme i) can reliably determine the type of fault ii) can accurately estimate the fault location (including the cases of highly resistive faults) and iii) is practically feasible.

ORCID iDs

Tzelepis, Dimitrios ORCID logoORCID: https://orcid.org/0000-0003-4263-7299, Mirsaeidi, Sohrab, Dyśko, Adam ORCID logoORCID: https://orcid.org/0000-0002-3658-7566, Hong, Qiteng ORCID logoORCID: https://orcid.org/0000-0001-9122-1981, He, Jinghan and Booth, Campbell ORCID logoORCID: https://orcid.org/0000-0003-3869-4477;
  • Item type:Article
    ID code:72926
    Dates:
    Date
    Event
    18 June 2020
    Published
    18 June 2020
    Published Online
    13 June 2020
    Accepted
    Notes:© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Depositing user: Pure Administrator
    Date deposited:25 Jun 2020 11:55
    Last modified:18 Dec 2024 13:59
    URI:https://strathprints.strath.ac.uk/id/eprint/72926
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