PD activity in void type dielectric samples for varied DC polarity

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Corr, Edward and Siew, W. H. and Zhao, Weijia (2016) PD activity in void type dielectric samples for varied DC polarity. In: Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), 2016-10-16 - 2016-10-19, Eaton Chelsea.

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Abstract

This paper discusses the DC testing of a dielectric sample (with voids) under DC conditions. The ramp test method was employed to assess whether the tests were repeatable. Three DC ramp tests were performed in quick succession. The polarity of the first/third tests was positive and the polarity of the second test was negative. The resultant partial discharge activity was analyzed for each series of tests and compared for positive and negative conditions. The results show that the inclusion of a negative ramp between two positive ramps enabled similar PD activity to be recorded in the first and second positive ramp tests. The negative cycle was used to re-initialise the test sample and allows trapped charge to migrate enabling similar PD activity in the subsequent positive ramp test. Changes in PD behavior were observed in the distribution of PD data between the tests.

ORCID iDs

Corr, Edward ORCID logoORCID: https://orcid.org/0000-0003-1980-4642, Siew, W. H. ORCID logoORCID: https://orcid.org/0000-0003-4000-6856 and Zhao, Weijia ORCID logoORCID: https://orcid.org/0000-0002-3055-7665;
  • Item type:Conference or Workshop Item(Paper)
    ID code:58336
    Dates:
    Date
    Event
    16 October 2016
    Published
    26 August 2016
    Accepted
    7 June 2016
    Submitted
    Notes:© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Depositing user: Pure Administrator
    Date deposited:28 Oct 2016 08:27
    Last modified:11 Nov 2024 16:47
    Related URLs:
    URI:https://strathprints.strath.ac.uk/id/eprint/58336
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