Developments in dielectric techniques for non-destructive examination

Banks, W.M. and Hayward, D. and Pethrick, R.A. and Armstrong, G.S. and Crane, R.L.; (2002) Developments in dielectric techniques for non-destructive examination. In: Proceedings of the 25th Annual Meeting of The Adhesion Society. Adhesion Society, Florida, USA. ISBN 1086-9506

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Abstract

Paper on the development in dielectric techniques for non-destructive examination.