Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures

Edwards, P.R. and Martin, R.W. and O'Donnell, K.P. and Watson, I.M. (2003) Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures. Journal of Physics: Conference Series (180). pp. 293-296. ISSN 1742-6596

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Abstract

Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations

ORCID iDs

Edwards, P.R. ORCID logoORCID: https://orcid.org/0000-0001-7671-7698, Martin, R.W. ORCID logoORCID: https://orcid.org/0000-0002-6119-764X, O'Donnell, K.P. ORCID logoORCID: https://orcid.org/0000-0003-3072-3675 and Watson, I.M. ORCID logoORCID: https://orcid.org/0000-0002-8797-3993;
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