Characterisation of amorphous and nanocrystalline molecular materials by total scattering

Billinge, Simon J L and Dykhne, Timur and Juhas, Pavol and Bozin, Emil and Taylor, Ryan and Florence, Alastair and Shankland, Kenneth (2010) Characterisation of amorphous and nanocrystalline molecular materials by total scattering. CrystEngComm, 12 (5). pp. 1366-1368. ISSN 1466-8033 (https://doi.org/10.1039/b915453a)

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Abstract

The use of high-energy X-ray total scattering coupled with pair distribution function analysis produces unique structural fingerprints from amorphous and nanostructured phases of the pharmaceuticalscarbamazepine and indomethacin. The advantages of such facility-based experiments over laboratory-based ones are discussed and the technique is illustrated with the characterisation of a melt-quenched sample of carbamazepine as a nanocrystalline (4.5 nm domain diameter) version of form III.

ORCID iDs

Billinge, Simon J L, Dykhne, Timur, Juhas, Pavol, Bozin, Emil, Taylor, Ryan, Florence, Alastair ORCID logoORCID: https://orcid.org/0000-0002-9706-8364 and Shankland, Kenneth;
CORE (COnnecting REpositories)