Preface for the special issue on Microscopy of Semiconducting Materials 2019

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Walther, Thomas and Calahorra, Yonatan and Massabuau, Fabien (2020) Preface for the special issue on Microscopy of Semiconducting Materials 2019. Semiconductor Science and Technology, 35 (12). 120201. ISSN 0268-1242 (https://doi.org/10.1088/1361-6641/abb6b9)

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Abstract

This issue contains selected invited and contributed presentations from the 21st international conference on 'Microscopy of Semiconducting Materials' held at Fitzwilliam College, University of Cambridge, on 9–12 April 2019. The meeting was organised by the Institute of Physics, supported by the Royal Microscopical Society, the European Microscopy Society, attolight (Platinum sponsor), JEOL (Gold sponsor) and ThermoFisher Scientific (Silver sponsor).

ORCID iDs

Walther, Thomas, Calahorra, Yonatan and Massabuau, Fabien ORCID logoORCID: https://orcid.org/0000-0003-1008-1652;
CORE (COnnecting REpositories)