Developments in dielectric techniques for non-destructive examination

Banks, W.M. and Hayward, D. and Pethrick, R.A. and Armstrong, G.S. and Crane, R.L.; (2002) Developments in dielectric techniques for non-destructive examination. In: Proceedings of the 25th Annual Meeting of The Adhesion Society. Adhesion Society, Florida, USA. ISBN 1086-9506

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Abstract

Paper on the development in dielectric techniques for non-destructive examination.

Creators(s): Banks, W.M., Hayward, D., Pethrick, R.A., Armstrong, G.S. and Crane, R.L.;
Item type:Book Section
ID code:5767
Keywords:dielectrics, mechanical engineering, adhesion, Mechanical engineering and machinery
Subjects:Technology > Mechanical engineering and machinery
Department:Faculty of Engineering > Mechanical and Aerospace Engineering
Faculty of Science > Pure and Applied Chemistry
Depositing user: Strathprints Administrator
Date deposited:01 May 2008
Last modified:28 Aug 2020 05:08
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URI:https://strathprints.strath.ac.uk/id/eprint/5767
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