Developments in dielectric techniques for non-destructive examination
Banks, W.M. and Hayward, D. and Pethrick, R.A. and Armstrong, G.S. and Crane, R.L.; (2002) Developments in dielectric techniques for non-destructive examination. In: Proceedings of the 25th Annual Meeting of The Adhesion Society. Adhesion Society, Florida, USA. ISBN 1086-9506
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Paper on the development in dielectric techniques for non-destructive examination.
Creators(s): | Banks, W.M., Hayward, D., Pethrick, R.A., Armstrong, G.S. and Crane, R.L.; | Item type: | Book Section |
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ID code: | 5767 |
Keywords: | dielectrics, mechanical engineering, adhesion, Mechanical engineering and machinery |
Subjects: | Technology > Mechanical engineering and machinery |
Department: | Faculty of Engineering > Mechanical and Aerospace Engineering Faculty of Science > Pure and Applied Chemistry |
Depositing user: | Strathprints Administrator |
Date deposited: | 01 May 2008 |
Last modified: | 24 Feb 2021 08:57 |
Related URLs: | |
URI: | https://strathprints.strath.ac.uk/id/eprint/5767 |
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