Developments in dielectric techniques for non-destructive examination

Banks, W.M. and Hayward, D. and Pethrick, R.A. and Armstrong, G.S. and Crane, R.L. (2002) Developments in dielectric techniques for non-destructive examination. In: Proceedings of the 25th Annual Meeting of The Adhesion Society. Adhesion Society, Florida, USA. ISBN 1086-9506

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Abstract

Paper on the development in dielectric techniques for non-destructive examination.

Author(s):	Banks, W.M., Hayward, D., Pethrick, R.A., Armstrong, G.S. and Crane, R.L.
Item type:	Book Section
ID code:	5767
Keywords:	dielectrics, mechanical engineering, adhesion, Mechanical engineering and machinery
Subjects:	Technology > Mechanical engineering and machinery
Department:	Faculty of Engineering > Mechanical and Aerospace Engineering Faculty of Science > Pure and Applied Chemistry
Depositing user:	Strathprints Administrator
Date deposited:	01 May 2008
Last modified:	31 May 2019 00:57
Related URLs:	http://www.adhesionsociety.org/
URI:	https://strathprints.strath.ac.uk/id/eprint/5767
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