Developments in dielectric techniques for non-destructive examination

Banks, W.M. and Hayward, D. and Pethrick, R.A. and Armstrong, G.S. and Crane, R.L.; (2002) Developments in dielectric techniques for non-destructive examination. In: Proceedings of the 25th Annual Meeting of The Adhesion Society. Adhesion Society, Florida, USA. ISBN 1086-9506

Abstract

Paper on the development in dielectric techniques for non-destructive examination.

• Share and Export
  

  RDF+XMLBibTeXRIOXX2 XMLRDF+N-TriplesJSONDublin CoreAtomSimple MetadataReferMETSHTML CitationASCII CitationOpenURL ContextObjectEndNoteOpenURL ContextObject in SpanMODSMPEG-21 DIDLEP3 XMLData Cite XMLRIS (EndNote Online, Zotero, Ref manager, etc)RDF+N3Multiline CSV
• Item metadata

  Item type:	Book Section
  ID code:	5767
  Dates:	Date Event 2002 Published
  Subjects:	Technology > Mechanical engineering and machinery
  Department:	Faculty of Engineering > Mechanical and Aerospace Engineering Faculty of Science > Pure and Applied Chemistry
  Depositing user:	Strathprints Administrator
  Date deposited:	01 May 2008
  Last modified:	11 Nov 2024 14:32
  Related URLs:	http://www.adhesionsociety.org/
  URI:	https://strathprints.strath.ac.uk/id/eprint/5767