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Lim, T.C. and Medellin, H. and Torres-Sanchez, C. and Corney, J.R. and Ritchie, J.M. and Davies, J.B.C. (2005) Edge-based identification of DP-features on freeform solids. IEEE Transactions on Pattern Analysis and Machine Intelligence, 27 (6). pp. 851-860. ISSN 0162-8828
Van Wyk, M.A. and Durrani, T.S. and Van Wyk, B. (2002) A RKHS interpolator-based graph matching algorithm. IEEE Transactions on Pattern Analysis and Machine Intelligence, 24 (7). pp. 988-995. ISSN 0162-8828
Lim, T.C. and Corney, J.R. and Clark, D. (2001) Laminae-based feature recognition. IEEE Transactions on Pattern Analysis and Machine Intelligence, 23 (9). pp. 1043-1048. ISSN 0162-8828