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Number of items: 2.
Bedford, T.J. and Alkali, B. (2008) Modelling competing risks and opportunistic maintenance with expert judgement. In: ESREL Conference, 2008-09-22 - 2008-09-25. (Unpublished)
Bedford, T.J. and Quigley, J.L. and Walls, L.A. (2006) Fault tree inference for one-shot devices using Bayes and empirical Bayes methods. In: ESREL Conference, 2006-05-02.