Browse by ISBN
Jump to: M
Number of items: 1.
M
Mitiche, Imene and Nesbitt, Alan and Boreham, Philip and Stewart, Brian G. and Morison, Gordon; (2019) Naive bayes multi-label classification approach for high-voltage condition monitoring. In: 2018 IEEE International Conference on Internet of Things and Intelligence System (IOTAIS). IEEE, IDN, pp. 162-166. ISBN 9781538673584