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Pincik, E. and Kobayashi, H. and Jurecka, S. and Jergel, M. and Gleskova, H. and Takahashi, M. and Brunner, R. and Fujiwara, N. and Mullerova, J.; Chu, J. and Lai, Z. and Wang, L. and Xu, S., eds. (2004) Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. In: Proccedings of the fifth international conference on thin film physics and applications. SPIE--The International Society for Optical Engineering., CHN, pp. 481-488. ISBN 9780819457554