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Schmueser, Ilka and Blair, Ewen O. and Isiksacan, Ziya and Li, Yifan and Corrigan, Damion K. and Stokes, Adam A. and Terry, Jonathan G. and Mount, Andrew R. and Walton, Anthony J.; (2020) Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures. In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). IEEE, Piscataway, N.J.. ISBN 978-1-7281-4008-7