Design and testing of isolated gate driver for cryogenic environments

Elwakeel, Abdelrahman and McNeill, Neville and Peña Alzola, Rafael and Surapaneni, Ravi Kiran and Galla, Gowtham and Ybanez, Ludovic and Zhang, Min and Yuan, Weijia (2024) Design and testing of isolated gate driver for cryogenic environments. IEEE Transactions on Applied Superconductivity, 34 (3). pp. 1-4. 3800704. ISSN 1051-8223 (https://doi.org/10.1109/tasc.2024.3356496)

[thumbnail of Elwakeel-etal-IEEE-TAS-2024-Design-and-testing-of-isolated-gate-driver]
Preview
 Text. Filename: Elwakeel-etal-IEEE-TAS-2024-Design-and-testing-of-isolated-gate-driver.pdf
Accepted Author Manuscript
License: Creative Commons Attribution 4.0 logo
Download (1MB)| Preview

Abstract

Aiming to increase the power density of electrical systems and realize all-electric aircraft, research has been focused on immersing power electronics at cryogenic temperatures as they tend to have lower conduction and switching losses. To ensure proper switching of semiconductor devices at cryogenic temperature, their gate driver circuits should ideally be placed in close physical proximity and therefore in the same environment. Although some commercial off-the-shelf gate drivers have been tested at cryogenic temperatures, in this article we present a bespoke magnetically isolated gate driver for cryogenic temperatures. Experiments with the circuit immersed in liquid nitrogen verify the proposals of the article.

ORCID iDs

Elwakeel, Abdelrahman, McNeill, Neville, Peña Alzola, Rafael, Surapaneni, Ravi Kiran, Galla, Gowtham, Ybanez, Ludovic, Zhang, Min ORCID logoORCID: https://orcid.org/0000-0003-4296-7730 and Yuan, Weijia ORCID logoORCID: https://orcid.org/0000-0002-7953-4704;
CORE (COnnecting REpositories)