Fault location in DC microgrids based on a multiple capacitive earthing scheme

Makkieh, Ahmad and Psaras, Vasileios and Pena Alzola, Rafael and Tzelepis, Dimitrios and Emhemed, Abdullah and Burt, Graeme (2020) Fault location in DC microgrids based on a multiple capacitive earthing scheme. IEEE Journal of Emerging and Selected Topics in Power Electronics. ISSN 2168-6777 (https://doi.org/10.1109/JESTPE.2020.2995946)

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Abstract

This paper presents a new method for locating faults along feeders in a DC microgrid using a multiple capacitive earthing scheme. During fault conditions, capacitors within the earthing scheme are charging by transient currents that correlate to the fault distance and resistance. Therefore, by assessing the response of the capacitive earthing scheme during the fault, the distance to fault is estimated. The proposed method uti- lizes instantaneous current and voltage measurements (obtained from the feeder terminals and earthing capacitors) applied to an analytical mathematical model of the faulted feeder. The proposed method has been found to accurately estimate the fault position along the faulted feeder and systematic evaluation has been carried out to further scrutinize its performance under different loading scenarios and highly-resistive faults. Addition- ally, the performance and practical feasibility of the proposed method has been experimentally validated by developing a low- voltage laboratory prototype and testing it under a series of test conditions.

  • Item type:Article
    ID code:72591
    Dates:
    Date
    Event
    20 May 2020
    Published
    20 May 2020
    Published Online
    5 May 2020
    Accepted
    Notes:© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Depositing user: Pure Administrator
    Date deposited:04 Jun 2020 15:54
    Last modified:18 Apr 2024 00:27
    URI:https://strathprints.strath.ac.uk/id/eprint/72591
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