Characterisation of a deep-ultraviolet light-emitting diode emission pattern via fluorescence

McFarlane, Mollie and McConnell, Gail (2020) Characterisation of a deep-ultraviolet light-emitting diode emission pattern via fluorescence. Measurement Science and Technology, 31 (7). 077001. ISSN 0957-0233 (https://doi.org/10.1088/1361-6501/ab78c1)

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Abstract

Recent advances in LED technology have allowed the development of high-brightness deep-UV LEDs with potential applications in water purification, gas sensing and as excitation sources in fluorescence microscopy. The emission pattern of an LED is the angular distribution of emission intensity and can be mathematically modelled or measured using a camera, although a general model is difficult to obtain and most CMOS and CCD cameras have low sensitivity in the deep-UV. We report a fluorescence-based method to determine the emission pattern of a deep-UV LED, achieved by converting 280 nm radiation into visible light via fluorescence such that it can be detected by a standard CMOS camera. We find that the emission pattern of the LED is consistent with the Lambertian trend typically obtained in planar LED packages to an accuracy of 99.6%. We also demonstrate the ability of the technique to distinguish between LED packaging types.

ORCID iDs

McFarlane, Mollie ORCID logoORCID: https://orcid.org/0000-0003-3921-8894 and McConnell, Gail ORCID logoORCID: https://orcid.org/0000-0002-7213-0686;
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