Numerical analysis of a transmission line illuminated by a random plane-wave field using stochastic reduced order models

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Fei, Zhouxiang and Huang, Yi and Zhou, Jiafeng and Song, Chaoyun (2017) Numerical analysis of a transmission line illuminated by a random plane-wave field using stochastic reduced order models. IEEE Access, 5. pp. 8741-8751. ISSN 2169-3536 (https://doi.org/10.1109/ACCESS.2017.2702205)

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Abstract

A novel nonintrusive statistical approach, known as the stochastic reduced order model (SROM) method, is applied to efficiently estimate the statistical information of the terminal response (i.e., the induced current) in transmission lines excited by a random incident plane-wave field. The idea of the SROM method is conceptually simple, i.e., to represent the uncertain input space dimensioned by random variables using the SROM-based input model. This input model consists of a very small number of selected samples with assigned probabilities. Thus, only these input samples in the model need to be evaluated using the deterministic solver. The SROM-based output model can be constructed to approximate the propagated uncertainty to the real output response with elementary calculation. The efficiency and accuracy of the SROM method to obtain the statistics of the induced current are analyzed using two examples, where the complexity of the uncertain input space gradually increases. The performance of the SROM method is compared with that of the traditional Monte Carlo (MC) method. The stochastic collocation (SC) method based on sparse grid sampling strategy computed via the Smolyak algorithm is also implemented to fairly evaluate the SROM performance. The result shows that the SROM method is much more efficient than the MC method to obtain accurate statistics of the induced current, and even shows a faster convergence rate compared with that of the SC method in the examples considered. Therefore, the SROM method is a suitable approach to investigate the variability of radiated susceptibility in electromagnetic compatibility problems with a random incident wave.

ORCID iDs

Fei, Zhouxiang ORCID logoORCID: https://orcid.org/0000-0002-5003-3949, Huang, Yi, Zhou, Jiafeng and Song, Chaoyun;
  • Item type:Article
    ID code:71960
    Dates:
    Date
    Event
    28 June 2017
    Published
    23 March 2017
    Accepted
    Notes:(c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
    Subjects:Science > Mathematics
    Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Depositing user: Pure Administrator
    Date deposited:02 Apr 2020 09:09
    Last modified:12 Dec 2024 09:33
    URI:https://strathprints.strath.ac.uk/id/eprint/71960
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